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5.2

Status Window

5.3

Device Specific Selections

5.4

Single Tone FET

5.4.1

Parameter Controls

User Interface

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The lower left portion of the TSW1200 user interface software window under the TI logo is reserved for
reporting status, warnings, errors, and informational output. When the TSW1200 software is first run, it
queries the TSW1200EVM and displays the revision of the FPGA firmware and the type of ADC interface
the TSW1200EVM is expecting to see based on jumper settings J10 and J11. At any time, this initial
information can be displayed again by selecting the Reinitialize Instrument option in the Instrument
Options tab of the toolbar.

During operation of the TS1200 software, warnings may appear in the status window if selections made
from the drop-down menus of the interface are incompatible with the hardware selections or settings. If an
ADC selection is made that is not supported by the TSW1200EVM jumper settings of J10 and J11, then a
message in the status window prompts the user for a different device selection or to set the jumpers to the
proper position on the hardware. If a sample rate is entered that is faster than that supported by a
particular ADC data sheet, then a warning is displayed in the status window.

Drop-down menus that are specific to a particular ADC device selection are located along the top of the
display under the toolbar.

The first selection a user makes is to select a type of ADC device from the device selection drop-down
menu. Each ADC that has an ini file installed in the proper directory automatically has an entry in the
device selection drop-down menu.

Once an ADC device part number is selected, the ADC Channel can be selected in the Channel selection
drop-down menu. The proper number of channel selections are made available based on the ADC device
selection.

The format for display of the captured data is chosen in the Test Selection drop-down menu. Single Tone
FFT displays the power spectrum of the captured data with calculated AC performance statistics. Time
Domain displays the raw captured data in the format of a logic analyzer display and output level over time.

In the Window Display drop-down menu, the user chooses a windowing function to be applied to the
captured data. Rectangular Window applies a unity gain to all data points of the captured data. A Hanning
Window, Hamming Window, or Blackman-Harris Window function can be applied to the captured data for
situations where the sample rate and the input frequency are not or cannot be set precisely to capture an
integer number of cycles of the input frequency (sometimes called coherent frequency).

The Capture button initiates a data capture once all other selections are made. The data capture can be a
single capture and display, or a continuous repeating capture.

The Single Tone FFT test is shown in

Figure 11

The larger central pane displays the FFT power

spectrum, whereas the calculated statistics are grouped into categories on the right of the screen. Settings
and inputs relevant to the test are entered in drop-down menus or text input boxes on the left portion of
the window.

The sampling rate is entered in the ADC Sampling Rate text box, also called the Sampling Frequency FS.
The number is entered in Hertz (Hz), although the letter M may be appended to represent the sampling
rate in MHz. For example, 125M = 125 MHz or 125,000,000 Hz.

The expected input frequency is entered in the ADC Input Frequency input box, also known as FC. If the
Auto Calculation of Coherent Input Frequency mode is enabled, then this input frequency is adjusted up or
down slightly away from the input frequency automatically. If coherent input frequency is required, the
signal generator used to source the input frequency must be set to this exact calculated coherent
frequency. The coherent frequency calculation takes the sampling frequency, the input frequency as
entered by the user, and the FFT record length and adjusts the input frequency so that the captured data
starts and ends on the same place of the sine wave of the input frequency. This avoids an artifact of the

18

TSW1200EVM: High-Speed LVDS Deserializer and Analysis System

SLAU212A – April 2007 – Revised August 2008

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Содержание TSW1200EVM

Страница 1: ...1200 User Interface Installation 13 8 Hardware Device Manager 14 9 Found New Hardware Windows 15 10 User Interface Initial Setup Screen 16 11 User Interface Single FFT format 20 12 User Interface Time...

Страница 2: ...EW is a trademark of National Instruments Corporation MATLAB is a trademark of The MathWorks Inc Xilinx is a trademark of Xilinx Inc TSW1200EVM High Speed LVDS Deserializer and Analysis System 2 SLAU2...

Страница 3: ...DS line one bit at a time at a higher data rate than the sample rate of the ADC The firmware in the FPGA on the TSW1200 is designed to accommodate both parallel DDR formats and serial LVDS formats alt...

Страница 4: ...e ended CMOS output The TSW1200 FPGA has enough FIFO buffer to capture as much as a 65536 sample record length from the continuous sample data stream coming from the LVDS ADC interface The TSW1200 FPG...

Страница 5: ...N TI recommends that the black banana jack J14 be connected to a bench ground even if the 6 V external power brick is connected to J7 Intermittent loss of the USB connection can sometimes be observed...

Страница 6: ...FPGA Bit file CFG1 jumper J10 set to LO and jumper J11 set to HI is defined for use with ADC EVMs that employ a parallel LVDS DDR dual data rate format Bit file CFG2 is defined for use with ADC EVMs t...

Страница 7: ...one JTAG device connected to the TDI of the next JTAG device The normal setting of the JTAG jumpers is to connect the TDI of the JTAG connector to the TDI pin of the FPGA EEPROM through jumper J12 pi...

Страница 8: ...derived from the onboard oscillator LED D2 labeled DCM on the TSW1200 silkscreen which is an abbreviation for the digital clock manager block of logic in the FPGA flashes when an LVDS clock from the...

Страница 9: ...amtec connector Fourteen LVDS data pairs plus two LVDS clock pairs have a defined position in the connector pinout that is common between the TSW1200EVM and many TI ADC EVMs For the parallel LVDS DDR...

Страница 10: ...he operational mode of the ADC under evaluation There SPI signals are by default not connected on the ADC EVM until a 0 resistor is installed on the EVM to enable control of the SPI port from the TSW1...

Страница 11: ...ure depth for an FFT on a million continuous data samples or more For this the output header posts are available so that a logic analyzer can be used to capture ADC data in real time The pinout of the...

Страница 12: ...1200 Installation CD and are installed during the installation process The USB is accessed as a virtual communication port VCP and shows up in the Hardware Device Manager as TSW1200 under COM ports an...

Страница 13: ...200 User Interface Installation If the TSW1200 user interface software is being installed on a machine that has an older version TI recommends that you first remove the old TSW1200 installation using...

Страница 14: ...onnected the TSW1200EVM to the PC the TSW1200 can be located in the Hardware Device Manager as shown in Figure 8 The TSW1200 appears as TSW1200 as a COM port Each time the USB cable is connected it is...

Страница 15: ...iguration for the PC If the Found New Hardware Wizard does appear again when the USB cable is reconnected follow the same responses to the dialog boxes as when the TSW1200 was first installed Figure 9...

Страница 16: ...chosen from the test pulldown menu Figure 10 User Interface Initial Setup Screen The toolbar contains options and settings that are independent of the device selected for test or the test to be perfor...

Страница 17: ...st Later revisions of the TSW1200 software will allow for setting test parameters for a Dual Tone FFT test and the ACPR test For a Single Tone FFT test the RMS line may be enabled or disabled When ena...

Страница 18: ...nce statistics Time Domain displays the raw captured data in the format of a logic analyzer display and output level over time In the Window Display drop down menu the user chooses a windowing functio...

Страница 19: ...marker to any place in the power spectrum such as a noise spur that is not already marked as a harmonic By default this additional marker initially goes to the highest spur that is not identified as...

Страница 20: ...d third fourth and fifth harmonics of the input frequency and the user selectable marker are displayed in either dBFS or dBc Test setup Input parameters relevant to the test are repeated particularly...

Страница 21: ...n results window In the upper half of the window the arithmetic value of the sample is represented on the vertical scale In the lower half of the window the individual bits of the data are displayed a...

Страница 22: ...e can open a com port to the USB channel and can perform the register reads and writes to the TSW1200 hardware One common request for another user interface is MATLAB as the user might then want to us...

Страница 23: ...1 2 C17 1uF C17 1uF 1 2 R109 300 R109 300 C44 01uF C44 01uF 1 2 C43 1uF C43 1uF 1 2 R58 24 3K R58 24 3K C349 10uF 10 16V C349 10uF 10 16V 1 2 C53 10uF 16V 10 LOW ESR C53 10uF 16V 10 LOW ESR C49 1uF C4...

Страница 24: ...SDA 10 GND8 8 P3 3 30 P3 1 31 P3 0 32 GND28 28 X2 26 RI CP 16 DCD 15 VCC25 25 U1 4 XC4VLX25 SF363 BGA U1 4 XC4VLX25 SF363 BGA IO_L20P_7 R19 IO_L20N_VREF_7 R20 IO_L21P_7 R15 IO_L21N_7 R16 IO_L23P_VRN_7...

Страница 25: ...F C79 10uF J10 HEADER 3 J10 HEADER 3 1 2 3 J2 J2 2 4 6 8 10 12 14 1 3 5 7 9 11 13 C86 1uF C86 1uF 1 2 R3 0 ohm R3 0 ohm C83 3 3uF C83 3 3uF R52 4 7K R52 4 7K R2 0 ohm R2 0 ohm R33 1K R33 1K Q3 DTC114E...

Страница 26: ...6 IO_L4P_5 B17 IO_L4N_VREF_5 C17 IO_L5P_5 D16 IO_L5N_5 E16 IO_L6P_5 A18 IO_L6N_5 B18 IO_L7P_5 D17 IO_L7N_5 D18 IO_L8P_CC_LC_5 B19 IO_L8N_CC_LC_5 C20 IO_L9P_CC_LC_5 F18 IO_L9N_CC_LC_5 E18 IO_L10P_5 C18...

Страница 27: ...10 8 9 J18 HDR 16X2 MALE 100CTR TI_SILKTEXT J18 HDR 16X2 MALE 100CTR TI_SILKTEXT 1 2 4 6 8 10 12 14 16 18 20 22 24 26 28 30 32 3 5 7 9 11 13 15 17 19 21 23 25 27 29 31 J6 HEADER MALE 20x2 POS 100 VERT...

Страница 28: ...onic 10 10V 2 C77 C78 22 pF 603 GRM1885C2A220JA01D Murata 5 100V 2 C81 C85 0 1 F 603 ECJ 1VB1H104K Panasonic 10 50V 2 C82 C84 2 2 F 603 ECJ 1VB1A225K Panasonic 10 10V 1 C83 3 3 F TANT_B TAJB335K016R A...

Страница 29: ...o 1 1 10W 8 R27 R30 22 603 RC0603FR 0722RL Yageo 1 1 10W R60 R63 6 R33 R34 R37 R 1K 603 ERJ 3EKF1001V Panasonic 1 1 10W 38 R46 R47 2 R35 R36 100 603 ERJ 3EKF1000V Panasonic 1 1 10W 1 R45 100K 603 ERJ...

Страница 30: ...I Provide pad 1 U14 PTH03000W SMD_PWRMOD_EUT5 PTH03000WAS TI TI Provide 1 U15 TPS73225 SOT23 DBV5 TPS73225DBVT TI TI Provide 1 Y1 12MHz w 18pF smd_xtal_AMB3B ABM3B 12 000MHZ 10 1 Abracon U T 4 Screw 4...

Страница 31: ...m Circuit Board Layout and Layer Stackup Figure 19 TSW1200C Layout Layer Two SLAU212A April 2007 Revised August 2008 TSW1200EVM High Speed LVDS Deserializer and Analysis System 31 Submit Documentation...

Страница 32: ...ard Layout and Layer Stackup www ti com Figure 20 TSW1200C Layout Power Plane 32 TSW1200EVM High Speed LVDS Deserializer and Analysis System SLAU212A April 2007 Revised August 2008 Submit Documentatio...

Страница 33: ...Circuit Board Layout and Layer Stackup Figure 21 TSW1200C Layout Ground Plane SLAU212A April 2007 Revised August 2008 TSW1200EVM High Speed LVDS Deserializer and Analysis System 33 Submit Documentatio...

Страница 34: ...Board Layout and Layer Stackup www ti com Figure 22 TSW1200C Layout Layer 5 34 TSW1200EVM High Speed LVDS Deserializer and Analysis System SLAU212A April 2007 Revised August 2008 Submit Documentation...

Страница 35: ...i com Circuit Board Layout and Layer Stackup Figure 23 TSW1200C Layer 6 SLAU212A April 2007 Revised August 2008 TSW1200EVM High Speed LVDS Deserializer and Analysis System 35 Submit Documentation Feed...

Страница 36: ...Board Layout and Layer Stackup www ti com Figure 24 TSW1200C Bottom Layer 36 TSW1200EVM High Speed LVDS Deserializer and Analysis System SLAU212A April 2007 Revised August 2008 Submit Documentation F...

Страница 37: ...com Circuit Board Layout and Layer Stackup Figure 25 Circuit Board Stackup SLAU212A April 2007 Revised August 2008 TSW1200EVM High Speed LVDS Deserializer and Analysis System 37 Submit Documentation F...

Страница 38: ...uct This notice contains important safety information about temperatures and voltages For additional information on TI s environmental and or safety programs please contact the TI application engineer...

Страница 39: ...siness practice TI is not responsible or liable for any such statements TI products are not authorized for use in safety critical applications such as life support where a failure of the TI product wo...

Страница 40: ...Mouser Electronics Authorized Distributor Click to View Pricing Inventory Delivery Lifecycle Information Texas Instruments TSW1200EVM...

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