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Operating Basics
Figure 16: Configuring Chirp measurement for host
4.
Select the Host option to display the different tests for the DUT. The
available tests are:
EL_33, EL_34: You can perform two separate measurements on an
acquired waveform
EL_35: You can perform a single measurement on an acquired
waveform
Figure 17: Configuring Chirp measurement for device
5.
Select the Device option to display the different tests for the DUT. The
available tests are:
EL_28, EL_29: You can perform two separate measurements on an
acquired waveform
EL_31: You can perform a single measurement on an acquired
waveform
38
TDSUSB2 Universal Serial Bus Measurement Package
Содержание TDS5032
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