![Silicon Laboratories Si5340 Скачать руководство пользователя страница 18](http://html1.mh-extra.com/html/silicon-laboratories/si5340/si5340_manual_1271791018.webp)
S i 5 3 4 1 / 4 0
18
Preliminary Rev. 0.9
Table 13. Absolute Maximum Ratings
1,2,3,4
Parameter
Symbol
Test Condition
Value
Units
Storage Temperature Range
T
STG
–55 to +150
°C
DC Supply Voltage
V
DD
–0.5 to 3.8
V
V
DDA
–0.5 to 3.8
V
V
DDO
–0.5 to 3.8
V
Input Voltage Range
V
I1
IN0-IN2, FB_IN
-0.85 to 3.8
V
V
I2
IN_SEL[1:0],
RST,
OE,
SYNC,
I2C_SEL,
SDI,
SCLK,
A0/CS
A1,
SDA/SDIO
FINC/FDEC
-0.5 to 3.8
V
V
I3
XA/XB
-0.5 to 2.7
V
Latch-up Tolerance
LU
JESD78 Compliant
ESD Tolerance
HBM
100 pF, 1.5 k
2.0
kV
Storage Temperature Range
T
STG
–55 to 150
°C
Junction Temperature
T
JCT
-55 to 150
°C
Soldering Temperature
(Pb-free profile)
5
T
PEAK
260
°C
Soldering Temperature Time at T
PEAK
(Pb-free profile)
5
T
P
20-40
sec
Notes:
1.
Permanent device damage may occur if the absolute maximum ratings are exceeded. Functional operation should be
restricted to the conditions as specified in the operational sections of this data sheet. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
2.
64-QFN and 44-QFN packages are RoHS-6 compliant.
3.
For more packaging information, go to www.silabs.com/support/quality/pages/RoHSInformation.aspx.
4.
Moisture sensitivity level is MSL2.
5.
The device is compliant with JEDEC J-STD-020.