SU320CSX
4110-0446, Rev. C
Page 79 of 96
© 2017 UTC
Aerospace Systems
Date Printed: 3-Jan-2017
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Parameters
none
Return Values
value
Range
ON
Binning Mode Enabled
OFF
Binning Mode Disabled
Type
string
Example
BIN:ENABLE? -- query command
ON -- return value
5.19.
Test Commands
The Test Pattern mode can be used to verify the integrity of the data collection. When this mode is
enabled, the camera returns one of four image patterns with predictable values. The timing of the data
presenting on the Camera Link interface remains unchanged from when active pixel data is returned. The
test pattern data is returned for all pixels. The Test Pattern conforms to the current Window size. See
Section 5.21 Windowing Commands. The test pattern data is only transmitted over the interface as
described if the Digital Signal Source is set to PAT. (See Digital Source command.)
5.19.1.
Set Test Pattern State
Description
Sets the test pattern state. When ON, a test pattern is returned in
place of data from the focal plane array. One of four patterns may
be selected.
Setting Type
Global
Command
TESTPAT
state
Parameters
state
Return Values
Range
ON TP0
Enable test pattern TP0
ON TP1
Enable test pattern TP1
ON TP2
Enable test pattern TP2
ON TP3
Enable test pattern TP3
OFF
Disable test pattern
Type
string
Example
TESTPAT ON TP0
TESTPAT ON (Defaults to TP0)
TESTPAT TP2 (ON is default)
TESTPAT OFF