Four-Point Probe System
User Manual
2
Ossila Limited © 2022
1.
Overview
The Ossila Four-Point Probe System is part of the Institute of Physics award-winning Solar Cell
Prototyping Platform*. It is a low-cost solution for rapid and reliable measurement of the sheet
resistance, resistivity, and conductivity of materials.
The system includes a four-point probe, source measure unit, and easy-to-use PC software
—
enabling more laboratories to measure sheet resistance for an affordable price. The probe head
uses gentle spring-loaded contacts instead of sharp needles, minimising damage to delicate
samples (e.g., polymer films that are only a few nanometres thick).
It is operated via the specifically designed PC software, which automatically calculates appropriate
geometrical correction factors for the sample to give accurate values for the sheet resistance. If
the sample thickness is provided, the software will further calculate resistivity and conductivity.
*The Ossila Solar Cell Prototyping Platform is a complementary collection of substrates, materials,
and equipment as part of a high-performance standard photovoltaic reference architecture. This
platform enables researchers to produce high-quality, fully functional solar cells which can be used
as a reliable baseline.
ossila.com/pages/solar-cell-prototyping-platform
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