
51.4.4.7 BYPASS instruction
BYPASS selects the bypass register, creating a single-bit shift register path between TDI
and TDO. BYPASS enhances test efficiency by reducing the overall shift path when no
test operation of the MCU is required. This allows more rapid movement of test data to
and from other components on a board that are required to perform test functions. While
the BYPASS instruction is active the system logic operates normally.
51.4.5 Boundary scan
The boundary scan technique allows signals at component boundaries to be controlled
and observed through the shift-register stage associated with each pad. Each stage is part
of a larger boundary scan register cell, and cells for each pad are interconnected serially
to form a shift-register chain around the border of the design. The boundary scan register
consists of this shift-register chain, and is connected between TDI and TDO when the
EXTEST, SAMPLE, or SAMPLE/PRELOAD instructions are loaded. The shift-register
chain contains a serial input and serial output, as well as clock and control signals.
51.5 Initialization/Application information
The test logic is a static logic design, and TCK can be stopped in either a high or low
state without loss of data. However, the system clock is not synchronized to TCK
internally. Any mixed operation using both the test logic and the system functional logic
requires external synchronization.
To initialize the JTAGC block and enable access to registers, the following sequence is
required:
1. Place the JTAGC in reset through TAP controller state machine transitions controlled
by TMS
2. Load the appropriate instruction for the test or action to be performed
Initialization/Application information
K22F Sub-Family Reference Manual, Rev. 4, 08/2016
1394
NXP Semiconductors
Содержание K22F series
Страница 2: ...K22F Sub Family Reference Manual Rev 4 08 2016 2 NXP Semiconductors...
Страница 150: ...Private Peripheral Bus PPB memory map K22F Sub Family Reference Manual Rev 4 08 2016 150 NXP Semiconductors...
Страница 168: ...Module clocks K22F Sub Family Reference Manual Rev 4 08 2016 168 NXP Semiconductors...
Страница 198: ...Security Interactions with other Modules K22F Sub Family Reference Manual Rev 4 08 2016 198 NXP Semiconductors...
Страница 258: ...Functional description K22F Sub Family Reference Manual Rev 4 08 2016 258 NXP Semiconductors...
Страница 292: ...Functional description K22F Sub Family Reference Manual Rev 4 08 2016 292 NXP Semiconductors...
Страница 398: ...Functional description K22F Sub Family Reference Manual Rev 4 08 2016 398 NXP Semiconductors...
Страница 628: ...Initialization and application information K22F Sub Family Reference Manual Rev 4 08 2016 628 NXP Semiconductors...
Страница 740: ...Initialization Application Information K22F Sub Family Reference Manual Rev 4 08 2016 740 NXP Semiconductors...
Страница 750: ...Functional description K22F Sub Family Reference Manual Rev 4 08 2016 750 NXP Semiconductors...
Страница 816: ...Application information K22F Sub Family Reference Manual Rev 4 08 2016 816 NXP Semiconductors...
Страница 866: ...Initialization Application Information K22F Sub Family Reference Manual Rev 4 08 2016 866 NXP Semiconductors...
Страница 890: ...Application information K22F Sub Family Reference Manual Rev 4 08 2016 890 NXP Semiconductors...
Страница 1028: ...Initialization Procedure K22F Sub Family Reference Manual Rev 4 08 2016 1028 NXP Semiconductors...
Страница 1040: ...Example configuration for chained timers K22F Sub Family Reference Manual Rev 4 08 2016 1040 NXP Semiconductors...
Страница 1118: ...Device mode IRC48 operation K22F Sub Family Reference Manual Rev 4 08 2016 1118 NXP Semiconductors...
Страница 1122: ...USB Voltage Regulator Module Signal Descriptions K22F Sub Family Reference Manual Rev 4 08 2016 1122 NXP Semiconductors...
Страница 1180: ...Initialization application information K22F Sub Family Reference Manual Rev 4 08 2016 1180 NXP Semiconductors...
Страница 1302: ...Application information K22F Sub Family Reference Manual Rev 4 08 2016 1302 NXP Semiconductors...
Страница 1374: ...Functional description K22F Sub Family Reference Manual Rev 4 08 2016 1374 NXP Semiconductors...