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The initialization trigger output provides a trigger signal that is used for on-chip modules.
39.4.22 Capture Test mode
The Capture Test mode allows to test the CnV registers, the FTM counter and the
interconnection logic between the FTM counter and CnV registers.
In this test mode, all channels must be configured for
and FTM
counter must be configured to the
When the Capture Test mode is enabled (CAPTEST = 1), the FTM counter is frozen and
any write to CNT register updates directly the FTM counter; see the following figure.
After it was written, all CnV registers are updated with the written value to CNT register
and CHnF bits are set. Therefore, the FTM counter is updated with its next value
according to its configuration. Its next value depends on CNTIN, MOD, and the written
value to FTM counter.
The next reads of CnV registers return the written value to the FTM counter and the next
reads of CNT register return FTM counter next value.
NOTE
FTM counter clock
write to MODE
CAPTEST bit
FTM counter
write to CNT
CHnF bit
CnV
- FTM counter configuration: (FTMEN = 1), (QUADEN = 0), (CAPTEST = 1), (CPWMS = 0), (CNTIN = 0x0000), and
(MOD = 0xFFFF)
- FTM channel n configuration: input capture mode - (DECAPEN = 0), (COMBINE = 0), and (MSnB:MSnA = 0:0)
0x0300
0x78AC
set CAPTEST
clear CAPTEST
write 0x78AC
0x1056
0x1053
0x1055
0x1054
0x78AC
0x78AD
0x78AE 0x78AF 0x78B0
Figure 39-82. Capture Test mode
Chapter 39 FlexTimer Module (FTM)
K22F Sub-Family Reference Manual, Rev. 4, 08/2016
NXP Semiconductors
1005
Содержание K22F series
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Страница 168: ...Module clocks K22F Sub Family Reference Manual Rev 4 08 2016 168 NXP Semiconductors...
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