NI DAQ 6052E, Руководство пользователя

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Glossary
NI 6052E User Manual G-10 ni.com
RTD resistance temperature detector—a metallic probe that measures
temperature based upon its coefficient of resistivity
RTSI bus real-time system integration bus—the National Instruments timing bus that
connects DAQ devices directly, by means of connectors on top of the
devices, for precise synchronization of functions
S
s seconds
S samples
S/s samples per second—used to express the rate at which a DAQ device
samples an analog signal
scan interval controls how often a scan is initialized and is regulated by the
STARTSCAN signal
scan rate reciprocal of the scan interval
SCANCLK scan clock signal
SCXI Signal Conditioning eXtensions for Instrumentation—the National
Instruments product line for conditioning low-level signals within an
external chassis near sensors so only high-level signals are sent to DAQ
devices in the noisy PC environment
settling time the amount of time required for a voltage to reach its final value within
specified limits
signal conditioning the manipulation of signals to prepare them for digitizing
SISOURCE SI counter clock signal
source impedance a parameter of signal sources that reflects current-driving ability of voltage
sources (lower is better) and the voltage-driving ability of current sources
(higher is better)
STARTSCAN start scan signal
system noise a measure of the amount of noise seen by an analog circuit or an ADC when
the analog inputs are grounded