National Instruments NI 447 Series, Руководство пользователя

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Index
© National Instruments Corporation I-5 NI 447X User Manual
acquisition start trigger, 3-17
delta-sigma ADCs and the oversample
clock, 3-14
relationship between sample rate and
oversample clock (table), 3-15
reset period as a function of sample rate
(table), 3-17
SYNC pulse, 3-15
system integration services, B-1
T
technical support, B-1
telephone technical support, B-2
test panels for acquiring signals, 2-10
testing device configuration, 2-3
theory of operation
analog input signal connections, 3-3
ADC, 3-9
analog input stage (figure), 3-3
anti-alias filtering, 3-4
calibration, 3-4
noise, 3-4
block diagrams
analog function block diagram, 3-2
digital function block diagram, 3-1
I/O connectors, 3-2
triggers, 3-11
above-high-level triggering mode
(figure), 3-12
below-low-level triggering mode
(figure), 3-12
high-hysteresis triggering mode
(figure), 3-13
inside-region triggering mode
(figure), 3-12
low-hysteresis triggering mode
(figure), 3-13
traceable recalibration, 4-3
training
customer, B-1
triggers, 3-11
above-high-level triggering mode
(figure), 3-12
below-low-level triggering mode
(figure), 3-12
digital trigger, 2-10
high-hysteresis triggering mode
(figure), 3-13
inside-region triggering mode
(figure), 3-12
low-hysteresis triggering mode
(figure), 3-13
specifications
analog trigger, A-7
digital trigger, A-7
troubleshooting resources, B-1
U
unpacking NI 447 X , 1-3
W
Web
professional services, B-1
technical support, B-1
worldwide technical support, B-2