MICRO-EPSILON scanCONTROL2800, Инструкция по эксплуатации

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MICRO-EPSILON
X9751109-B060097MSC 30
The terms "small", "standard" and "huge" are taken
from the programs.
Information for Operation
0
50
100
150
200
250
300
350
400
Fig. 8.5a: Image of the CMOS matrix in the measuring
space illustrated with LLT 2800-25
Fig. 8.4: Measuring field on the CMOS matrix
Demo Softwa re Mea suring field N umber of pixels
“Sma ll“ 95 (88 +7) 256 x 256
“Sta nda rd“ 50 (48 +2) 768 x 512
“La rge“ 18 (16 +2) 768 x 768
“H uge“ 0 1024 x 1024
Index x
0
1
2
3
4
5
6
7
-4 -3 -2 -1 0 1 2 3
128
Huge
Small
Standard
Large
Distance z
Index z
A slight displacement of the measuring field is possible and depends on sensor. The actual measuring field size is noted in
the sensor inspection log, see Chap. 13.4.
-100 -50 0 50 100
x in mm
Standard measuring range Extended measuring range
z in mm
Measuring
field 50
Measuring
field 0
Fig. 8.5b: Image of the CMOS matrix in the measuring
space illustrated with LLT 2800-100
0
50
100
150
200
250
300
350
400
z in mm
Standard measuring rnage
Extended measuring range
-100 -50 0 50 100
x in mm
Measuring
field 50
Measuring field 0