MI 3102(H) BT
Eurotest
XE
Measurements
43
5.5
Testing RCDs
Various test and measurements are required for verification of RCD(s) in RCD protected
installations. Measurements are based on the EN 61557-6 standard.
The following measurements and tests (sub-functions) can be performed:
contact voltage,
trip-out time,
trip-out current and
RCD auto-test.
See chapter
selection for
instructions on key functionality.
Figure 5.19: RCD tests
Test parameters for RCD test and measurement
TEST
RCD sub-function test
[Uc, RCDt, RCD I, AUTO]
I
N
Rated RCD residual current sensitivity I
N
[10 mA, 30 mA, 100 mA, 300 mA, 500
mA, 1000 mA].
type
RCD type
[AC, A, F, B*, B+*].
Starting polarity
[
,
,
,
,
*,
*].
Property selection
[selective
,general non-delayed
, PRCD, PRCD-K, PRCD-
S, MI RCD*, EV RCD*].
MUL
Multiplication factor for test current
[½, 1, 2, 5 I
N
].
Ulim
Conventional touch voltage limit
[25 V, 50 V].
* Model MI 3102 BT only
Notes:
Ulim can be selected in the Uc sub-function only.
Selective (time-delayed) RCDs have delayed response characteristics. As the contact
voltage pre-test or other RCD tests influence the time delayed RCD it takes a certain
period to recover into normal state. Therefore a time delay of 30 s is inserted before
performing trip-out test by default.
Portable RCDs (PRCD, PRCD-K and PRCD-S) are tested as general (non-delayed)
RCDs. Trip-out times, trip-out currents and contact voltage limits are equal to limits of
general (non-delayed) RCDs.
The a.c. part of MI and EV RCDs is tested as general (non-delayed) RCDs.
The d.c. part of MI and EV RCDs is tested with a d. c. test current. The Pass limit is
between 0.5 and 1.0 IdN
DC
.