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I
out
=0.5
A,T
J
=125
º
C
I
S
(current consump-
tion driver ship)
8 channels active
per chip; without
load
10
14
mA
I
L(off)
(output in inactive
state)
U
in
= U
out
= 0
V
0
5
30
μ
A
Switching Times
Measured Quantity
Test Criterion
MIN Type MAX Unit
t
on
(switch-on time)
R
L
= 47
Ω
, up to
90
% U
out
64
120
μ
s
t
off
(switch-off time)
R
L
= 47
Ω
, up to
10
% U
out
89
120
μ
s
dU
out
/dt
(on)
(slope on
switch-on)
R
L
= 47
Ω
, at
0..30
% U
out
U
ext
= 15
V
1
2
V/
μ
s
dU
out
/dt
(off)
(slope on
switch-off)
R
L
= 47
Ω
, at
70..40
% U
out
U
ext
= 15
V
1
2
V/
μ
s
Limiting Values
Measured Quantity
Test Criterion
MIN Type MAX Unit
T
CSD
(housing switch-
off temperature)
125 130 135
ºC
T
CR
(housing reset
temperature)
110
ºC
T
TSD
(junction switch-
off temperature)
150 175 200
ºC
T
R
(junction reset
temperature)
135
ºC
I
lim
(DC short-circuit
current)
U
ext
=24
V,
R
L
=10
m
Ω
1.1
A
Frequency Input/Output
Availability
alternative subdevice configuration via ME-iDC
Signal form
rectangular
Содержание ME-5004
Страница 12: ......