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Copyright © 2009 LG Electronics. Inc. All right reserved.
Only for training and service purposes
LGE Internal Use Only
4. TROUBLE SHOOTING
LGE Internal Use Only
4.16 Micro SD Trouble
TEST POINT
CIRCUIT
TP2
TP1
CN103
R134
R133
R132
R131
TP3
TP4
T
E
K
C
O
S
D
I
R
B
Y
H
M
I
S
&
D
S
u
2
1
6
D
N
G
1
1
0
1
A
W
S
B
W
S
9
3
4
4
5
5
6
6
7
7
8
8
C1
C1
C2
C2
C3
C3
C5
C5
C6
C6
C7
C7
1
D
N
G
6
1
5
1
2
D
N
G
4
1
3
D
N
G
4
D
N
G
3
1
5
D
N
G
1
0
9
7
1
0
0
Y
S
N
E
2
-
3
3
7
3
4
7
1
3
0
1
N
C
1
1
2
2
3
2
7
1
C
u
1
R134
56K
22p
C157
22p
C156
M
I
S
V
_
5
8
V
2
1
7
1
C
p
0
0
0
1
2V85_VSIM
2V85_VSIM
L106
100nH
0
6
1
C
u
1
.
0
D105
R133
56K
L105
100nH
D104
R136
56K
R132
56K
L107
100nH
6
0
0
1
_
E
D
O
I
D
_
I
N
D
D103
7
2
1
R
K
7
.
4
D102
R135
56K
6
0
1
U
F
-
R
T
-
D
1
8
2
K
4
0
1
P
R
1
0
6
5
5
3
0
Y
S
U
E
C
N
_
E
C
3
D
N
G
2
PGND
5
4
T
U
O
V
D
D
V
1
56K
R131
3
0
1
L
H
n
0
0
1
T
A
B
V
u
1
5
7
1
C
3
7
1
C
p
2
2
T
X
E
V
_
3
9
V
2
100nH
L104
N
E
_
O
D
L
_
F
T
SIM_CLK
SIM_RST
SIM_DATA
3
A
T
A
D
_
F
T
D
M
C
_
F
T
0
A
T
A
D
_
F
T
1
A
T
A
D
_
F
T
2
A
T
A
D
_
F
T
T
E
D
_
F
T
K
L
C
_
F
T
TP3
TP4
TP1
TP2