Measurement considerations ...................................................... I-2
Leakage currents and guarding ........................................... I-2
Input bias current ................................................................. I-3
Voltage burden ..................................................................... I-3
Voltage offset correction procedure ............................. I-4
Noise and source impedance ............................................... I-5
Source resistance .......................................................... I-5
Source capacitance ....................................................... I-6
Electrostatic interference and shielding .............................. I-7
Shielding vs. Guarding ............................................... I-10
Making connections .......................................................... I-10
Typical range change transients ........................................ I-12
Up-range input response ............................................ I-13
Down-range voltage transients are smaller ................ I-14
Steps to minimize impact of range change transients ....... I-15
Run test with a fixed range. ........................................ I-15
Down-range by starting at highest
current necessary ........................................................ I-15
Using protection circuitry .......................................... I-16
Reduce up-ranging transient ...................................... I-16
Zero check on / off response ............................................. I-16
Applications .............................................................................. I-18
Diode leakage current ........................................................ I-18
Capacitor leakage current .................................................. I-19
Measuring high resistance with external bias source ........ I-19
Cable insulation resistance ................................................ I-21
Surface insulation resistance (SIR) ................................... I-22
Photodiode characterization prior to dicing ...................... I-22
Focused ion beam applications .......................................... I-25
Using switching systems to measure
multiple current sources .................................................... I-26
Содержание 6485
Страница 1: ...Model 6485Picoammeter Instruction Manual A G R E A T E R M E A S U R E O F C O N F I D E N C E ...
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Страница 44: ...1 20 Getting Started Model 6485 Picoammeter Instruction Manual ...
Страница 66: ...3 6 Measurements Model 6485 Picoammeter Instruction Manual ...
Страница 138: ...9 20 Remote Operation Model 6485 Picoammeter Instruction Manual ...
Страница 159: ...11 CommonCommands ...
Страница 164: ...11 6 Common Commands Model 6485 Picoammeter Instruction Manual ...
Страница 165: ...12 SCPISignalOriented MeasurementCommands ...
Страница 190: ...14 12 SCPI Reference Tables Model 6485 Picoammeter Instruction Manual ...
Страница 214: ...16 14 Calibration Model 6485 Instruction Manual ...
Страница 219: ...A Specifications ...
Страница 221: ...B StatusandErrorMessages ...
Страница 227: ...C GeneralMeasurement Considerations ...
Страница 233: ...D DDCEmulationCommands ...
Страница 247: ...E ExamplePrograms ...
Страница 250: ...E 4 Example Programs Model 6485 Picoammeter Instruction Manual ...
Страница 251: ...F IEEE 488BusOverview ...
Страница 266: ...F 16 IEEE 488 Bus Overview Model 6485 Picoammeter Instruction Manual ...
Страница 267: ...G IEEE 488andSCPI ConformanceInformation ...
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