3
Operation
Introduction
This
c
hapter
con
tains
the
follo wing
information.
A
system
description
Op erational
tests
Pulsed-RF
measuremen
t
examples
Pulsed-RF
applications
Pulsed-RF
timing
information
External
pulse
mo
dulation
information
High
p o
w
er
measuremen
t
considerations
System
Description
Pulsed-RF
stim
ulus
may
b e
required
in
cases
where
con
tinuous
application
of
the
test
signal
could
destroy
the
device,
suc
h
as
when
testing
o ccurs
prior
to
pac
k
aging,
or
where
the
device
m
ust
b e
tested
using
a
PRF
and
dut
y
cycle
that
accurately
represen
ts
its
nal
application.
The
HP
8510
pulsed-RF
net
w
ork
analyzer
conguration
adds
sp ecialized
hardw
are
and
an
optimized
rm
w
are
feature
set
to
make
fully
error-corrected
S-parameter
measuremen
ts
of
pulsed-RF
resp onses.
F
or
the
rst
time,
the
com
bination
of
wideband
IF
and
accurate
timing
circuits
pro
vides
precise
sync
hronization
with
the
pulse,
allo wing
S-parameters
to
b e
measured
at
a
precisely
kno
wn,
rep eatable
time
during
the
pulse.
This
extends
the
HP
8510
applications
in
to
t
w
o
ma
jor
areas:
tests
in
whic
h
the
stimulus
signal
to
the
device
is
pulsed,
and
tests
of
devices
whic
h
accept
a
CW
input
and
pro duce
a
pulsed
output.
A
simplied
blo
c
k
diagram
of
the
system
is
sho
wn
in
Figure
3-1.
One
syn
thesizer
pro
vides
the
test
signal
stimulus
to
the
RF
input
of
the
test
set
and
the
other
pro
vides
the
LO
signal
to
the
four
frequency
con
v
erters
(only
t
w
o
are
sho
wn).
The
LO
source
is
alwa
ys
tuned
20
MHz
ab o
v
e
the
test
signal
source.
The
standard
in
ternal
phaselo c
k
tec
hnique
is
not
used;
instead,
a
common
10
MHz
frequency
reference
is
used
for
b oth
of
these
sources
and
the
in
ternal
sample
selection
and
timing
logic
in
the
HP
8510.
These
sources
are
considered
to
b e
coheren
t,
th
us
generating
the
correct
20
MHz
rst
IF
and
the
correct
clo
c
k
frequency
for
the
reference
and
test
sync
hronous
detectors.
This
eliminates
the
need
to
use
the
reference
signal
for
receiv
er
phaselo c
k
and
allo
ws
all
reference
and
test
signals
to
b e
pulsed,
thereb
y
making
fully
error-corrected
2-p ort,
pulsed-RF
S-parameter
measuremen
ts
p ossible.
Operation
3-1
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