HP 85108, Системное руководство

Страница: 134 / 136

N
net w ork analyzer measuremen t cycle, 3-23
O
op erating system
reloading, 6-8
op eration
system, 3-1
test set, 3-2
op erational test, 3-4
option 001, 3-3
options, 1-4
o v erview
do cumen t, 1-1
pulse measuremen ts, 3-12
system, 1-3
P
parts
replaceable, 7-1
p erformance v erication
non-standard systems, 4-3
p o w er lev els, 4-8
pro cedure, 4-4
recommended cycle, 4-4
required equipmen t, 4-3
p oint-in-pulse, 3-14
p ort 1 and p ort 2 atten uators, 3-32
p o w er on, 2-17
p o w er on sequence
failure, 6-8
p o w er outlet, 2-13
p o w er strip, 2-13
pulse detector adjustmen t, 5-2
pulse fall time, A-2
pulse generator
connecting, 3-26
pulse measuremen ts o v erview, 3-12
pulse prole domain, 3-16
pulse prole measuremen t resolution p erio d,
A-2
pulse rep etition frequency, A-1
pulse rep etition p erio d, 3-24
pulse rise time, A-2
pulse width, A-2
R
ra w p o w er lev els, 6-9
rear panel links, 3-30
receiving c hec klist, 2-2
replaceable parts, 7-1
ordering information, 7-1
requiremen ts
altitude, 2-3
co oling, 2-3
heating , 2-3
h umidity, 2-3
p o w er, 2-4
resolution p erio d, A-2
rise time, A-2
running error messages
for pulsed-RF systems, 6-6
S
sequence
calibration, 3-36
measuremen t, 3-36
service adapter test, 6-16
setting HP-IB addresses, 6-3
signal conditioning
external, 3-30
signal path
c hanging, 3-33
signal path c hec k, 6-10
source 1 p o w er lev el, 6-10
source settings, B-3
startup problems, 6-8
static electricit y, 2-6
stop sw eep, 3-25
storing data
trace memories, 3-34
system
general c haracteristics, 4-10
service, 6-1
troublesho oting, 6-1
system bus, 2-12
system conguration disk
loading, C-1
system description, 3-1
system o v erview, 3-1
system sp ecications
generating, 4-4
T
test set op eration, 3-2
trace memories
storing, 3-34
trigger dela y, A-2
troublesho oting
do cumen tation required, 6-2
error messages, 6-5
internal diagnostics, 6-5
system-lev el, 6-1
troublesho oting o w c hart, 6-13
Index-2