Fujitsu MAE3091LC SERIES, Руководство по эксплуатации продукта

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C141-E064-03EN 6 - 5
(1) Interface (SCSI bus) test
The operations of the SCSI bus and data buffer on the IDD are checked with the WRITE
BUFFER and READ BUFFER commands.
(2) Basic operation test
The basic operations of the IDD are checked by executing self-diagnosis with the SEND
DIAGNOSTIC command (see Subsection 6.1.1).
(3) Random/sequential read test
The positioning (seek) operation and read operation are tested in random access and sequential
access modes with the READ, READ EXTENDED, or VERIFY command.
(4) Write/read test
By using a data block in the internal test space, the write/read test can be executed with an
arbitrary pattern for a disk drive in which user data is stored.
6.2 Maintenance Information
6.2.1 Maintenance requirements
(1) Preventive maintenance
Preventive maintenance such as replacing air filters is not required.
CAUTION
Damage
Do not open the DE in the field because it is completely sealed.
(2) Service life
The service life under suitable conditions and treatment is as follows. The service life is
depending on the environment temperature. Therefore, the user must design the system
cabinet so that the average DE surface temperature is as possible as low.
•
DE surface temperature: 45°C or less 5 years
•
DE surface temperature: 46°C to 50°C 4 years
•
DE surface temperature: 51°C to 55°C 3 years
•
DE surface temperature: 56°C and more strengthen cooling power so that DE
surface temperature is 55°C or less.
Even if the IDD is used intermittently, the longest service life is 5 years.