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4-2
PIM-P Analyzer User’s Manual
Copyright AWT-Global, LLC. All rights reserved.
Caution
DO NOT touch RF Connecting parts of components with bare
fingers.
Even the smallest amount of sweat on the conductors can cause oxidation,
which will reduce the performance of the element and can cause PIM.
Elements Included:

RF Port of PIM-P

Low PIM Cables

Low PIM Load

Low PIM Adapters

All components in the transmitting path of the System under Test
or DUT.
Caution
DO NOT switch on RF power without load or antenna
attached.
Switching RF power on without termination, results in the full
transmitted energy of the test system being reflected back into the test
system. This can overstress the system cause damage. The load ensures
energy flow from the test system to the load, which transforms all RF
energy into heat.
Caution
DO NOT operate the PIM-P in any active systems.
The PIM-P is a very sensitive Test System that allows testing and
analyzing passive RF components. Under no circumstances should the
tester be operated when the RF path is active, no outside carrier signals
should be present in the RF path under test. This includes all active
signals even when they are operating in different frequency bands.
Operation with active signals present will cause serious damage to the
instrument.
Caution
DO NOT connect or disconnect any accessory or component of
the test setup with RF power switched on.
Even at low RF power levels, spark discharge can occur with sudden
energy flow or flow disruption. Spark discharge - must be avoided,
because it will alter the surface of the pins and connection areas.
“Burned” surfaces will not only reduce the performance of the
component, but can also cause permanent PIM.