Agilent Technologies E364 A Series, Руководство пользователя

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Chapter 4 Remote Interface Reference
System-Related Commands
86
OUTPut:RELay?
Query the state of the TTL relay logic signals.
SYSTem:BEEPer
Issue a single beep immediately.
SYSTem:ERRor?
Query the power supply’s error queue. A record of up to 20 errors is stored in
the power supply’s error queue. Errors are retrieved in first-in-first-out (FIFO)
order. The first error returned is the first error that was stored. When you have
read all errors from the queue, the
ERROR
annunciator turns off and the errors
are cleared. See ‘‘
Error Messages
’’, starting on page 113 for more details.
SYSTem:VERSion?
Query the power supply to determine the present SCPI version. The returned
value is of a string in the form YYYY.V where the ‘‘Y’s’’ represent the year of
the version, and the ‘‘V’’ represents a version number for that year (for example,
1997.0).
SYSTem:COMMunicate:GPIB:RDEVice
:ADDRess {
<numeric value>
}
:ADDRess?
Set or query the bus address of the peripheral device. Changing the address
with this does not affect the address of the peripheral device. It does affect the
address to which data is sent by the instrument.
*IDN?
Read the power supply’s identification string. The power supply returns four
fields separated by commas. The first field is the manufacturer’s name, the
second field is the model number, the third field is not used (always ‘‘0’’), and
the
fourth field
is a revision code which contains three numbers. The first
number is the firmware revision number for the main power supply processor;
the second is for the
input/output
processor; and the third is for the front-panel
processor.
The command returns a string with the following format (be sure to dimension
a string variable with at least
40 characters
):
Agilent Technologies,E3640A,0,X.X-Y.Y-Z.Z
(E3640A model)
*TST?
Perform a
complete
self-test of the power supply. Returns ‘‘0’’ if the self-test
passes or ‘‘1’’ or any non-zero value if it fails. If the self-test fails, an error
message is also generated with additional information on why the test failed.