Agilent Technologies 16451B, Руководство по эксплуатации

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Dielectric constant and dissipation factor of a test material can be
obtained using the following equations .
P arameters Needed:
C
p
Equivalent parallel capacitance [F]
D Dissipation factor
t
a
A verage thickness of test material [m]
A Area of Guarded thin lm electrode [m
2
]
d Diameter of Guarded thin lm electrode [m]
o
=8.854210
-12
[F/m]
Equations:
r
=
t
a
2 C
p
A 2
o
=
t
a
2 C
p
2
d
2
2
2
o
D
t
= D
Where ,
r
Dielectric constant of test material
D
t
Dissipation factor of test material
Thin Film Electrode
When this method is used, a metallic thin lm is applied on surface of
the test material. F or more details , refer to \Thin Film Electrode " in
\Preparation of T est Material".
Operation 3-17