Agilent Technologies 16451B, Руководство по эксплуатации

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Contacting Electrode
Method (used with
Thin Film Electrode)
This method uses thin lm electrodes applied on the test material.
The thin lm electrodes contact with the 16451B 's electrodes . This
method is applicable for materials on which the thin lm electrodes
can be applied without changing its characteristics . It should be
noted that it is dicult to remove the thin lm electrodes after the
measurement. The merits and demerits of this method are as follows:
Merits
Air lm (error caused by air gap between the electrode and
surface of the test material) causes minimum error
Procedure to measure capacitance is simple
Equations to obtain dielectric constant are simple
Demerits
It is necessary to apply the thin lm electrodes (Not applicable to
materials which change their characteristics because of applying
the thin lm electrodes .)
Principle
Figure 3-11 shows the schematic electrode structure for this method.
Figure 3-11. Contacting Electrode Method (Thin Film Electrode)
3-16 Operation