LISA-C2 series and FW75-C200 - System Integration Manual
UBX-13000620 - R21
Early Production Information
Design-In
Page 66 of 103
Reference
Description
Remarks
ESD
Varistor for ESD protection.
CT0402S14AHSG - EPCOS
C1, C2
47 pF Capacitor Ceramic C0G 0402 5% 50 V
GRM1555C1H470JA01 - Murata
FB1, FB2
Chip Ferrite Bead for Noise/EMI Suppression
BLM15HD182SN1 - Murata
Rint
10 k
Ω
Resistor 0402 5% 0.1 W
Internal pull-up resistor
Table 34: Example of components as ESD immunity test precautions for the HW_SHUTDOWN line
SIM interface
Sensitive interface is the SIM interface (
VSIM
pin,
SIM_RST
pin,
SIM_IO
pin,
SIM_CLK
pin):
•
A 47 pF bypass capacitor (e.g. Murata GRM1555C1H470J) have to be mounted on the lines connected to
VSIM
,
SIM_RST
,
SIM_IO
and
SIM_CLK
to assure SIM interface functionality when an electrostatic discharge
is applied to the application board enclosure.
•
It is suggested to use as short as possible connection lines at SIM pins.
SIM card interface is supported in software only by LISA-C200 versions 03S/23S onwards
2.5.2
Antenna interface precautions
The antenna interface
ANT
can have a critical influence on the ESD immunity test depending on the application
board handling. Antenna precaution suggestions are provided:
•
If the device implements an embedded antenna and the device insulating enclosure avoids air discharge up
to +8 kV / -8 kV to the antenna interface, no further precautions to ESD immunity test should be needed.
•
If the device implements an external antenna and the antenna and its connecting cable are provided with a
completely insulating enclosure to avoid air discharge up to +8 kV / -8 kV to the whole antenna and cable
surfaces, no further precautions to ESD immunity test should be needed.
•
If the device implements an external antenna and the antenna or its connecting cable are not provided with
completely insulating enclosure to avoid air discharge up to +8 kV / -8 kV to the whole antenna and cable
surfaces, the following precautions to ESD immunity test should be implemented on the application board.
A higher protection level is required at the
ANT
port if the line is externally accessible on the application board.
ESD immunity test requires protection up to +4 kV / -4 kV for direct Contact Discharge and up to +8 kV / -8 kV
for Air Discharge applied to the antenna port. One possible suggested solution for higher protection is to
implement an external high pass filter, consisting of a series 15 pF capacitor (Murata GRM1555C1H150JA01)
and a shunt 39 nH coil (Murata LQG15HN39NJ02) at the antenna port as described in Figure 38 and Table 35.
Antenna detection functionality is not provided when implementing the high pass filter described in Figure
38 and Table 35., as ESD protection for the antenna port LISA-C200 / FW75-C200.
