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SLOS743L – AUGUST 2011 – REVISED MARCH 2017
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Detailed Description
Copyright © 2011–2017, Texas Instruments Incorporated
6.15.3.4 Test Registers
6.15.3.4.1 Test Register (0x1A)
describes the Test register at address 0x1A.
Table 6-54. Test Register (0x1A) (for Test or Direct Use)
Default:
0x00 at POR = H and EN = L.
Bit
Name
Function
Description
B7
OOK_Subc_In
Subcarrier input
OOK pin becomes decoder digital input
B6
MOD_Subc_Out
Subcarrier output
MOD pin becomes receiver digitized subcarrier output
B5
MOD_Direct
Direct TX modulation and
RX reset
MOD pin becomes input for TX modulation control by the MCU
B4
o_sel
First stage output selection
o_sel = L: First stage output used for analog out and digitizing
o_sel = H: Second Stage output used for analog out and digitizing
B3
low2
Second stage gain –6 dB,
HP corner frequency / 2
B2
low1
First stage gain –6 dB, HP
corner frequency / 2
B1
zun
Input followers test
B0
Test_AGC
AGC test, AGC level is
seen on rssi_210 bits
6.15.3.4.2 Test Register (0x1B)
describes the Test register at address 0x1B.
Table 6-55. Test Register (0x1B) (for Test or Direct Use)
Default:
0x00 at POR = H and EN = L. When a test_dec or test_io is set IC is switched to test mode. Test Mode persists until a stop
condition arrives. At stop condition the test_dec and test_io bits are cleared.
Bit
Name
Function
Description
B7
test_rf_level
RF level test
B6
B5
B4
B3
test_io1
I/O test
Not implemented
B2
test_io0
B1
test_dec
Decoder test mode
B0
clock_su
Coder clock 13.56 MHz
For faster test of coders