![background image](http://html1.mh-extra.com/html/texas-instruments/tms320c6472/tms320c6472_user-manual_1095288137.webp)
www.ti.com
EMAC Port Registers
5.39 Back Off Test Register (BOFFTEST)
The back off test register (BOFFTEST) is shown in
Figure 81
and described in
Table 75
.
Figure 81. Back Off Test Register (BOFFTEST)
31
26
25
16
Reserved
RNDNUM
R-0
R-0
15
12
11
10
9
0
COLLCOUNT
Reserved
TXBACKOFF
R-0
R-0
R-0
LEGEND: R = Read only; -n = value after reset
Table 75. Back Off Test Register (BOFFTEST) Field Descriptions
Bit
Field
Value
Description
31-26
Reserved
0
Reserved
25-16
RNDNUM
Back off random number generator. This field allows the Back off Random Number Generator to be
read. Reading this field returns the generator's current value. The value is reset to zero and begins
counting on the clock after the de-assertion of reset.
15-12
COLLCOUNT
Collision count. These bits indicate the number of collisions the current frame has experienced.
11-10
Reserved
0
Reserved
9-0
TXBACKOFF
Back off count. This field allows the current value of the back off counter to be observed for test
purposes. This field is loaded automatically according to the back off algorithm, and is decremented
by one for each slot time after the collision.
137
SPRUEF8F – March 2006 – Revised November 2010
C6472/TCI6486 EMAC/MDIO
Submit Documentation Feedback
Copyright © 2006–2010, Texas Instruments Incorporated