SBAS367F
–
JUNE 2007
–
REVISED FEBRUARY 2011
ELECTRICAL CHARACTERISTICS
All specifications at T
A
=
–
40
°
C to +105
°
C, AVDD = +5V, DVDD = +1.8V, IOVDD = +3.3V, f
CLK
= 27MHz, VREFP = 2.5V,
VREFN = 0V, and all channels active, unless otherwise noted.
ADS1274, ADS1278
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
ANALOG INPUTS
Full-scale input voltage (FSR
(1)
)
V
IN
= (AINP
–
AINN)
±
V
REF
V
Absolute input voltage
AINP or AINN to AGND
AGND
–
0.1
AVDD + 0.1
V
Common-mode input voltage (V
CM
)
V
CM
= (AINP + AINN)/2
2.5
V
High-Speed mode
14
k
Ω
High-Resolution mode
14
k
Ω
Differential input impedance
Low-Power mode
28
k
Ω
Low-Speed mode
140
k
Ω
DC PERFORMANCE
Resolution
No missing codes
24
Bits
f
CLK
= 37MHz
144,531
SPS
(3)
High-Speed mode
(2)
f
CLK
= 32.768MHz
128,000
SPS
f
CLK
= 27MHz
105,469
SPS
Data rate (f
DATA
)
High-Resolution mode
52,734
SPS
Low-Power mode
52,734
SPS
Low-Speed mode
10,547
SPS
Integral nonlinearity (INL)
(4)
Differential input, V
CM
= 2.5V
±
0.0003
±
0.0012
% FSR
(1)
Offset error
0.25
2
mV
Offset drift
0.8
μ
V/
°
C
Gain error
0.1
0.5
% FSR
Gain drift
1.3
ppm/
°
C
High-Speed mode
Shorted input
8.5
16
μ
V, rms
High-Resolution mode
Shorted input
5.5
12
μ
V, rms
Noise
Low-Power mode
Shorted input
8.5
16
μ
V, rms
Low-Speed mode
Shorted input
8.0
16
μ
V, rms
Common-mode rejection
f
CM
= 60Hz
90
108
dB
AVDD
80
dB
Power-supply rejection
DVDD
f
PS
= 60Hz
85
dB
IOVDD
105
dB
V
COM
output voltage
No load
AVDD/2
V
(1)
FSR = full-scale range = 2V
REF
.
(2)
f
CLK
= 37MHz max for High-Speed mode, and 27MHz max for all other modes. See
for f
CLK
restrictions in High-Speed mode.
(3)
SPS = samples per second.
(4)
Best fit method.
©
2007
–
2011, Texas Instruments Incorporated
3
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