
3
Faults description
The following sections describe all the faults collected by FCCU for SPC582Bx device and how, if possible, to
inject them for checking the integrity of the relevant reaction path.
The following convention is adopted in the following figures:
1.
a green arrow marks the faults injectable by the FCCU fake fault interface;
2.
a blue arrow marks the faults injectable by using a SW procedure to stimulate the fault;
3.
a red arrow marks the faults that the user cannot inject.
3.1
PMC_DIG faults
PMC_DIG is the source of five different FCCU input faults.
For further details on PMC_DIG, refer to the device SPC582Bx microcontroller reference manual
Figure 3.
PMC_DIG faults
RGM
Error out
Reset request
reset
TSENS
FCCU
INTC
Interrupt request
Interrupt
LVDs
HVDs
DCF
BIST
PMC_Dig
Fault #2
Fault #0
Fault #1
Fault #3
Fault #4
Set
Clear
3.1.1
Temperature detector out of range (fault #0)
The temperature detector detects if the temperature exceeds the defined thresholds and the PMC_DIG forwards
this fault to the FCCU. There are three thresholds: TS0, TS1, and TS2. Temperature detector thresholds are
trimmed at testing phase and cannot be configured by the user.
The user cannot inject this fault.
3.1.2
Voltage out of range from LVDs (fault #1)
Each LVD detects a voltage that drops below the defined threshold and the PMC_DIG forwards this fault to the
FCCU. The MCU embeds some LVDs (for further details on LVDs, refer to SPC582Bx reference manual
and their output signals are put in OR before arriving at the FCCU failure input #1.
The user cannot inject this fault.
3.1.3
Voltage out of range from HVDs (fault #2)
Each HVD detects a voltage that raises above the defined threshold and the PMC_DIG forwards this fault to
the FCCU. The MCU embeds some HVDs (for further details on LVDs, refer to SPC582Bx reference manual
) and their output signals are put in OR before arriving at the FCCU failure input #2.
The user cannot inject this fault.
AN5752
Faults description
AN5752
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Rev 1
page 7/35