ST SPC582B Series, Application Note, Page: 3 / 35

FCCU input # Source Failure description Error reaction path
7 STCU BIST result-wrong signature (STCU recoverable fault) Testable
8 STCU MBIST control activation Testable
9 GLUE LOGIC
JTAG, NPC or debug functionality moved out of reset or
SSCM activation
Testable
10 PLATFORM/DMA DMA_1 gasket monitor error Not testable
11 PLATFORM/DSMC DSMC ECC error Not testable
12 PLATFORM/CORE Core_2 I-bus ECC error Not testable
13 PLATFORM/CORE Core_2 D-bus ECC error Not testable
14 PLATFORM/DMA DMA_1 ECC error Not testable
15 PLATFORM/DMA DMA_1 TCD EDC after ECC Not testable
16 FLASH_0/1 Flash reset error Not testable
18 PLATFORM/SWT SWT_2 reset request Testable
21 MEMU System RAM ECC correctable error Testable
22 MEMU System RAM ECC uncorrectable error Testable
23 MEMU
System RAM ECC overflow error
(1) Testable
24 MEMU Peripheral RAM ECC correctable error Testable
25 MEMU Peripheral RAM ECC uncorrectable error Testable
26 MEMU Peripheral RAM ECC overflow error
(2)
Testable
27 MEMU Flash ECC correctable error Testable
28 MEMU Flash ECC uncorrectable error Testable
29 MEMU Flash ECC overflow error Testable
30 IMA IMA activation Testable
32 PLATFORM/SMPU SMPU XBAR 1 monitor incorrectly refuses an access Not testable
34 PLATFORM/SMPU SMPU XBAR 1 monitor correctly refuses an access Testable
48 PLATFORM/DMA DMA_1 TCD RAM feedback error Testable
49 PLL DIG PLL0 loss of lock error Testable
50 PLL DIG PLL1 Loss of Lock error Testable
51 CMU
CMU_0 error (XOSC less than IRC, XTAL pin floating,
EXTAL pin floating)
Not testable
52 CMU
Frequency out of range
(3) Testable
53 CMU
Frequency out of range
(4) Testable
54 CMU
Frequency out of range
(5) Testable
56 PLATFORM/XBAR 1 XBIC error detected Testable
63 FLASH_0 Flash read reference error Testable
64 PLATFORM/FLASH_1 EDC after ECC error for Flash array Testable
65 PLATFORM/FLASH_1 EDC after ECC error for Flash controller Not testable
66 PLATFORM/FLASH_1 Flash encoding error Testable
67 PLATFORM/FLASH_1 PFLASH address feedback error Testable
74 PLATFORM/PRAM 2 Corrupted system RAM access or late-write buffer mismatch Not testable
75 PLATFORM/PRAM 2 EDC after ECC for system RAM Not testable
78 TCU Test circuitry group 1 activation Not testable
AN5752
Overview
AN5752 - Rev 1
page 3/35