•
Contrary to the conditions described above, operation is also possible provided
the test of the housing temperature at the position specified in the graphic does
not result in values above 75 °C outside on the cooling element during a period of
time of 4 hours of operation.
Degradation of ambient temperature
Depending on the following device configurations, degradation of the permitted ambi‐
ent temperature must be taken into account:
•
CPU load
≥
75% (can be read using SICK AppStudio)
0
10
20
30
40
50
60
0
20
40
60
80
100
120
A
mb
ie
nt
t
e
mp
e
ra
tu
re
[
°
C
]
CPU load [%]
Figure 1: Degradation of ambient temperature depending on the CPU capacity
MOUNTING
5
8020764/1FTA/2022-05-02 | SICK
O P E R A T I N G I N S T R U C T I O N S | SIM2000ST
19
Subject to change without notice
