NXP Semiconductors
UM11637
FRDMGD3160DCMHB evaluation board
Status tab
•
Allows monitoring of Status 1, Status 2, and Status 3 register values
•
Status 1 and Status 2 faults can be cleared
•
Status mask registers can be modified when in configuration mode
Figure 33. Status tab
Pulse tab
•
Used for double pulse, short circuit, and PWM testing
•
Select desired T1, T2, and T3 timings for each test type; select enable then generate
pulses
Figure 34. Pulse tab
UM11637
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User guide
Rev. 2 — 3 February 2022
37 / 42
