Product Features
6
SmartLab: Automated Multipurpose X-ray Diffractometer
Optical device detection
SmartLab Guidance can check the conditions of the following optical devices
used for measurement.
• Selection slit in CBO unit
• Type of incident Soller slit or crystal monochromator
• Width of incident slit
• Length of length-limiting slit or type of collimator
• Width of receiving slit
• Type
of
analyzer
• Type of receiving Soller slit
• Type
of
detector
• Presence/absence of diffracted beam monochromator, etc.
SmartLab Guidance checks whether the necessary optical devices are installed
and displays a message for the optical configurations suitable for the user’s
intended application. The measurement data file stores parameters for the optical
devices during measurement to improve data reproducibility and traceability.
Control software (SmartLab Guidance)
SmartLab Guidance used to control SmartLab also guides the user through
required measurement procedures and condition-setting processes, in addition to
providing conventional SmartLab control functions. Optical device
configurations, optics alignment methods, sample alignment methods, and
measurement conditions specific to various measurement needs are grouped in
units called Package Measurements. By selecting an appropriate Package
Measurement for the analysis purpose, the user is guided through the procedures
of optics alignment, sample alignment, and data measurement. The program
provides the optimal alignment and measurement conditions for the desired
analysis.
Each Package Measurement was prepared by specialists with expertise in the
specific field of measurement methodology. Even users with limited experience
with x-ray diffraction or x-ray reflectivity measurements can perform
measurements in the same way a specialist would. The software also allows
customization of alignment and measurement conditions for special
measurement needs. Manual control is also possible. The software is designed to
meet a wide range of user needs.
