Attachments
86
SmartLab: Automated Multipurpose X-ray Diffractometer
Table Types of attachments
Name
Description
Description
Standard attachment
This attachment has no moving
axis.
It is used for reflectivity
measurements and measurements
of powder and bulk samples.
RxRy attachment
(option: 2680A213)
This attachment has Rx and Ry
axes that permit tilt adjustments of
two axes intersecting at right
angles.
It is used for RSM measurements
and various types of in-plane
measurements.
XY-20 attachment
(option: 2680A211)
This attachment has +/– 10 mm X
and Y translation axes which are
perpendicular to each other.
It is used to position the sample
for micro area measurements.
This attachment cannot be used
with 8-inch wafer sample plates.
XY-4” phi attachment
(option: 2680A212)
This attachment has +/– 50 mm
provides X and Y translation axes
which are perpendicular to each
other. It is used for full-map
measurement of 4-inch wafers.
This attachment can be used only
with the 4-inch XY mapping
sample plate.
Capillary spin attachment
(option: 2430C101)
This attachment is used to spin the
sample filled in a capillary during
measurements.
CAUTION
Do not use the pinhole collimator (option) with the XY-4” phi attachment.
When using the pinhole collimator with the XY-4” phi attachment, the end of
the pinhole collimator collides with the sample and/or the sample plate from
the translation of X and Y axes, and thus the pinhole collimator, the sample,
and the sample stage may become damaged.
The type of attachment installed can be identified from SmartLab Guidance.
