Princeton Instruments NIRvana-LN, User Manual, Page: 66 / 122

66 NIRvana
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-LN System Manual Issue 4
7.6 Flatfield Correction
The application of Flatfield Correction compensates for any non-uniformity of illumination
sources and/or non-uniformity of the InGaAs detector. Applying a flatfield correction is a
three-step process:
•
A reference flatfield image must be acquired and saved;
•
The data acquisition software must be configured to automatically apply the
acquired reference image;
•
Experiment data are acquired and the flatfield data are applied.
Perform the following procedure to apply flatfield correction to acquired experiment data:
1.
Configure experiment parameters within the data acquisition software.
2.
Wait until the detector has reached its operating temperature to ensure stability.
3.
Acquire a flatfield reference image of the illumination source without applying an input
source/sample.
4.
Save the acquired flatfield reference image on the host computer’s hard drive.
5.
Configure the data acquisition software to automatically apply the specified flatfield file
to newly acquired data.
Figure 7-5 illustrates how to enable automatic flatfield correction within WinSpec/32.
REFERENCES:
Refer to the LightField User’s Manual listed in Table 1-1 on
page 9 for information about enabling automatic flatfield
corrections.
Figure 7-5: WinSpec/32 Enabling Automatic Flatfield Correction
6.
Configure the experiment with the sample in place and acquire data.
The flatfield data will be automatically applied to the raw data, and the resulting data
will be displayed and/or stored.
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