-
106
-
9.3 Characteristic emissivity
In case none of the methods mentioned above help to determine the emissivity you may use the emissivity
table ►
and
. These are average values, only. The actual emissivity of a material
depends on the following factors:
•
temperature
•
measuring angle
•
geometry of the surface
•
thickness of the material
•
constitution of the surface (polished, oxidized, rough, sandblast)
•
spectral range of the measurement
•
transmissivity (e.g. with thin films)
Figure 54:
Adjustment of the emissivity in the software PIX Connect (menu
Tools/ Configuration/ Device
)
Summary of Contents for Xi 400
Page 1: ...Operator s Manual optris Xi 80 400 410 Spot finder IR camera...
Page 27: ...Mechanical Installation 27 Figure 5 Xi 80 dimensions mm...
Page 28: ...28 Figure 6 Xi 400 dimensions mm...
Page 29: ...Mechanical Installation 29 Figure 7 Xi 410 dimensions mm...
Page 34: ...34 Figure 11 Mounting bracket ACXIAPLAB dimensions mm weight 276 g...
Page 36: ...36 Figure 12 Water cooling ACXIW and mounting kit ACXIxxxWAK1 dimensions mm weight 1710 g...
Page 40: ...40 Figure 15 Shutter ACXIS dimensions mm weight 550 g...
Page 71: ...Functions 71 Figure 35 Possibilities of power supply for Xi 80 410 via Ethernet connection...
Page 79: ...Functions 79 Figure 37 Configurations menu Device PIF Figure 38 Setup...
Page 92: ...92 7 2 Software window Figure 45 Software window 1 2 3 2 5 6 7 9 4 10 11 12 1 8...
Page 107: ...Appendix A Table of emissivity for metals 107 Appendix A Table of emissivity for metals...
Page 108: ...108...
Page 118: ...118 Figure 58 Relay output at industrial PIF...
Page 119: ...Appendix G Declaration of Conformity 119 Appendix G Declaration of Conformity...
Page 120: ...optris Xi MA E2021 08 A...
