96
Se
c
tion 6
S
p
e
c
ific
a
tions
a
nd Dime
ns
ions
Heat-resistive RFID System
User's Manual
Section 6
Appendices
• Tag Heat Resistivity
• Storing Tags under high temperatures will adversely affect the performance of the internal parts and
the service life of the Tags.
• An LTPD of 10% was determined during the evaluation for Tags that reached the end of their life after
testing under the following test conditions
Heat cycle: Room temperature/200
°
C, 30 minutes each for 2,000 cycles
• Normal operation has been confirmed after performing the above tests, although minor cracks may
occur.
LTPD: Lot tolerance percent defective
The lower limit of the malfunction rate for lots to be considered unacceptable during reliability testing.
• Reference Data (Evaluation Test Results)
Room temp./180
°
C, 30 min each
Room temp./200
°
C, 30 min each
Room temp./220
°
C, 30 min each
0
500
1000
1500
2000
2500
3000
3500
4000
10%
9%
8%
7%
6%
5%
4%
3%
2%
1%
0%
Number of cycles
Def
ectiv
e r
ate (%)
Heat Resistance Evaluation Results
Defective Operation
