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Table 3. JTAG signal description
JTAG Mode
SWD Mode
Signal
TCK
SWCLK
Clock into the core
TDI
-
JTAG Test Data Input
TDO
SWV
JTAG Test Data Output / SWV trace data output
(SWO)
TMS
SWDIO
JTAG Test Mode Select / SWD data in/out
GND
GND
-
The pull up/down resitors for the JTAG signals are included internally by the default pad configuration. See the device reference
manual and datasheet.
5.1 Debug connector pinouts
5.1.1 20-pin Cortex Debug D ETM connector
Some newer ARM microcontroller board use a 0.05” 20-pin header (Samtec FTSH-110) for both debug and trace. (The signals
greyed out are not available on the Cortex-M3 or Cortex-M4.) The 20-pin Cortex Debug D ETM connector support both JTAG and
Serial Wire debug protocols. When the Serial debug protocol is used, the TDO signal can be used for Serial Wire Viewer output
for trace capture. The connector also provides a 4-bit wide trace port for capturing of trace that require a higher trace bandwidth
(example, when ETM trace is enabled).
NXP Semiconductors
Debug and programing interface
Hardware Design Guidelines for S32K1xx Microcontrollers , Rev. 3, December 2018
Application Note
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