NXP Semiconductors
UM11802
RDGD3162I3PH5EVB three-phase inverter reference design
6.2.6 Power supply test points
Figure 7. Power supply test point locations
Name
Function
VCCHU
high-side phase U VCC voltage test point
isolated positive voltage supply (9.3 V to 25 V)
GNDHU
isolated ground high-side phase U
VEEHU
negative gate supply voltage high-side phase U
VCCHV
high-side phase V VCC voltage test point
isolated positive voltage supply (9.3 V to 25 V)
GNDHV
isolated ground high-side phase V
VEEHV
negative gate supply voltage high-side phase V
VCCHW
high-side phase W VCC voltage test point
isolated positive voltage supply (9.3 V to 25 V)
GNDHW
isolated ground high-side phase W
VEEHW
negative gate supply voltage high-side phase W
VCCLU
low-side phase U VCC voltage test point
isolated positive voltage supply (9.3 V to 25 V)
GNDLU
isolated ground low-side phase U
VEELU
negative gate supply voltage low-side phase U
VCCLV
low-side phase V VCC voltage test point
isolated positive voltage supply (9.3 V to 25 V)
Table 5. Power supply test point descriptions
UM11802
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User manual
Rev. 1 — 10 June 2022
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