NXP Semiconductors
UM11636
KITPF5200SKTEVM evaluation board
Schematic label
Signal name
Description
J22-1-2
PGOOD/GPO
PGOOD / GPO mode; apply an external pull up
to PGOOD pin
J22-2-3
AMUX
Temperature sensor mode; no pull-up connected
to PGOOD pin
Table 11. PGOOD_SEL jumper (J22)
4.3.10 LED signaling
The LED signaling displays the state of the following signals:
•
Signals: PWRON, TBBEN, PGOOD, RESETBMCU and XFAIL
•
Regulators: SW1OUT and SW2OUT, LEDs light above 0.6 V.
•
Power supply: VIN
aaa-044590
R28
1.3 kΩ
R94
510 kΩ
RED
D1
P3V3_KL25Z
P5V_USB
Q5
P3V3_KL25Z
SW1OUT
R31
1.3 kΩ
C34
1.0 µF
C35
0.1 µF
D4
R88
10 kΩ
U8
5
5
6
1Y
1A
1
A
C
2
3
4
VDD
SW1OUT
R86
53.6 kΩ
P3V3_KL25Z
R87
10 kΩ
VSS
MCP6001T-E/OT
GND
GND
VDDIO
C38
1.0 µF
C39
0.1 µF
GND
GND
A
3
2
1
C
GND
P3V3_KL25Z
P3V3_KL25Z
SW2OUT
R32
1.3 kΩ
C36
1.0 µF
C37
0.1 µF
D4
R89
10 kΩ
U9
5
1
A
C
2
3
4
VDD
SW2OUT
R90
53.6 kΩ
P3V3_KL25Z
R92
10 kΩ
VSS
MCP6001T-E/OT
GND
GND
GND
GND
GND
2
GND
GND
VCC
XFAILB
VDDIO
R79
1.3 kΩ
R95
510 kΩ
D13
Q6
3
GND
A
3
2
1
C
2A
U10A
U
10
B
S
N
74
LV
C
2G
04
D
C
K
R
4 2Y
RESETBMCU
PWRON
R33
1.3 kΩ
R39
510 kΩ
PGOOD
D6
PGOOD
Q3
GND
A
3
2
1
C
R29
1.3 kΩ
RED
D2
A
C
R34
1.3 kΩ
R40
510 kΩ
TBBEN
D7
TBBEN
Q4
GND
A
3
2
1
C
GND
R30
1.3 kΩ
D3
A
C
VIN
GND
Figure 2. Power and Regulators LED indicators
4.3.11 Test points
The KITPF5200SKTEVM board has several test points that facilitate access and
measurements. This section summarizes the available test points, how they are color
coded, and whether they are a test point component with a part number or a through-hole
test point with no part number.
Orange: Test loop access to safety outputs and analog signals
Red: Test loop access for power supplies
Black: Test loop access to GND
UM11636
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2021. All rights reserved.
User manual
Rev. 2 — 13 December 2021
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