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National Instruments Corporation
7
SCXI-1141/1142/1143 Calibration Procedure
•
moduleSlot
—1
•
channel
—0
•
filterMode
—0
•
freq
—0 kHz
•
cutoffDivDown
—0
•
outClkDivDown
—2
9.
Input the test voltage listed in Table 9 to channel 0 of the SCXI
module.
10. Call
DAQ_Op
. Set the following parameters:
•
DAQdeviceNumber
—The device number for the DAQ device
•
channel
—0
•
gain
—1 for a 16-bit E Series DAQ device
•
count
—100
•
sampleRate
—100
11. Call
SCXI_Scale
to convert the readings from binary to voltage.
Set the following parameters:
•
SCXIChassisID
—The device number assigned by MAX
•
moduleSlot
—1
•
channel
—0
•
SCXIgain
—The gain you are testing
•
TBgain
—1
•
DAQboard
—The device number for the DAQ device
•
DAQChannel
—0
•
DAQgain
—1
•
numPoints
—100
•
binArray
—The array returned from
DAQ_Op
The result is a set of scaled voltages read from the SCXI module.
12. Average the results returned by
SCXI_Scale
. Compare the averaged
result to the upper and lower limits listed in Table 9.
13. Repeat steps 6 through 12 for each remaining test point.
14. Repeat steps 6 through 13 for each remaining channel, changing the
moduleChan
variable to the channel number you are testing.
You have finished verifying the operation of the SCXI-1141/1142/1143.