Note 1:
All devices are 100% production tested at T
A
= +25°C. Limits over the operating temperature range guaranteed by
design.
Note 2:
This value is included in the I
BAT
quiescent current values for the ON states.
Note 3:
When the die temperature exceeds T
CHGIN_SHDN
, the CHGIN to SYS path opens, and the charger is turned off.
Note 4:
When the die temperature exceeds T
CHG_LIM
, the charger current starts to decrease.
Note 5:
This is the threshold at which the charger starts to limit the current due to SYS dropping; if VSYS drops below this value
the charger will not move to maintain charge.
Note 6:
Fast charge current accuracy tested only at 50mA and 500mA, all other values guaranteed by design.
Note 7:
Values over temperature are not production tested and guaranteed by characterization.
Note 8:
f
SCL
must meet the minimum clock low time plus the rise/fall times.
Note 9:
The maximum t
HD:DAT
has to be met only if the device does not stretch the low period (t
LOW
) of the SCL signal.
Note 10:
Filters on SDA and SCL suppress noise spikes at the input buffers and delay the sampling instant.
(V
CHGIN
= 5.0V, V
BAT
= 3.7V, T
A
= -40°C to +85°C, all registers in their default state, unless otherwise noted. Typical values are at
T
A
= +25°C.) (Note 1)
MAX20335
PMIC with Ultra-Low I
Q
Voltage Regulators and
Battery Chargers for Small Lithium Ion Systems
www.maximintegrated.com
Maxim Integrated
│
21
Electrical Characteristics (continued)
