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6517B-900-01 Rev. A / Jun 2008
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4-19
Model 6517B Electrometer User’s Manual
Section 4: Measurement Options
Test sequences
The following information summarizes the built-in test sequences of the Model 6517B. Detailed
information on test sequences can be found in the Reference Manual.
Configuring test sequences
A test sequence is selected and configured from the CONFIGURE SEQUENCE menu as follows:
1.
Press
CONFIG
and then
SEQ
to display the sequence configuration menu.
2.
Place the cursor on
APPLICATIONS
and press
ENTER
. Select and configure a test from
the test sequence menu structure. To select a menu item, place the cursor on it and press
ENTER
. To change a parameter value, use the cursor and
RANGE
keys (
and
)
, and
press
ENTER
.
DEV-CHAR
Use to select a device characterization test:
DIODE:
Diode leakage current test. Specify start voltage, stop voltage, step
voltage, and delay.
CAPACITOR:
Capacitor leakage current test. Specify bias voltage, bias time, and
discharge time.
CABLE:
Cable insulation resistance test. Specify bias voltage and bias time.
RESISTOR:
Resistor voltage coefficient test. Specify source 1 voltage, delay 1,
source
2 voltage, and delay 2.
RESISTIVITY
Use to select a resistivity test:
SURFACE:
Surface resistivity test. Specify pre-discharge time, bias voltage, bias
time, measure voltage, measure time, and discharge time.
VOLUME:
Volume resistivity time. Specify pre-discharge time, bias voltage, bias
time, measure voltage, measure time, and discharge time.
SIR
Surface insulation resistance test: Use to select the SIR test. Specify bias voltage, bias time,
measure voltage, and measure time.
SWEEP:
Use to select a sweep test:
SQUARE-WAVE:
Square wave sweep test. Specify high-level voltage, time at high
level, low-level voltage, time at low level, and cycle count.
STAIRCASE:
Staircase sweep test. Specify start voltage, stop voltage, step
voltage, and step time.
3.
Press
EXIT
to display the following menu:
CONFIGURE SEQUENCE
Applications Control
4.
Place the cursor on
CONTROL
and press
ENTER
to display the control sources that can be
used to start the test. Place the cursor on the desired control source and press
ENTER
.
MANUAL:
Pressing the TRIG key will start the test.
IMMEDIATE:
Test will start immediately after it is armed.
LID-CLOSURE:
Test will start when the lid of the Model 8009 test fixture is closed.
GPIB:
Test will start when a bus trigger (*TRG or GET) is received by the Model
6517B.
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