Chapter 3 TEST MODE
IL-2000SA Service Manual
3-5
3.4 ALL DIAGNOSIS
This mode is used to test the machine in the factory. Note that all memories will be
initialized when this mode is used.
z
Operation
When the [EXECUTE] key is touched,
each test is carried out one by one.
Diagnostic Items
Operation Contents
Measures under Abnormal Conditions
SRAM read/write test
SRAM reading and writing test
(1) Defect of P-910
Test data setting
Master registration for each test
The display shows abnormality.
Head resistance setting
(initialization)
Automatic setting of head
resistance
(1) Defect of thermal head
(2) Defect of P-909
(3) Defect of harness “C2” thermal head
(63-5585-04)
Head dot status check
Thermal head failure check
(1) Defect of thermal head
(2) Defect of P-909
(3) Defect of harness “C2” thermal head
(63-5585-04)
RS-232C (D-sub) loop
check
RS-232C hardware check
* The check cable is required.
(1) Defect of P-910
(2) Defect of P-907
(3) Defect of harness “C2” RS-232C
(63-8459-20)
Card slot (upper) check PCMCIA (upper) hardware check
* The check cable is required.
(1) Defect of P-910
Card slot (lower) check PCMCIA (lower) hardware check
* The check cable is required.
(1) Defect of P-910
I
2
NET (ELAN) self
check
I
2
NET (ELAN) hardware check
(1) Defect of P-910
I
2
NET (ILAN) self check I
2
NET (ILAN) hardware check
(1) Defect of P-910
Communication check
(ELAN
→
ILAN)
I
2
NET loopback hardware check
* The check cable is required.
(1) Defect of P-910
Communication check
(ILAN
→
ELAN)
I
2
NET loopback hardware check
* The check cable is required.
(1) Defect of P-910
DISCONTINUED
Summary of Contents for IL-2000SA
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