Hioki 3522-50, Instruction Manual

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5.6 Testing Using EXT I/O
────────────────────────────────────────────────────
Meaning Timing (approximate)
T1 Minimum time period for trigger signal recognition 100
μ
s
T2
Time period from trigger to circuit response 300
μ
s +
α
(
α
depends on the sample
under test and the trigger delay)
T3
Analog measurement time; chucking switching on
INDEX (HIGH) possible
(Note 1)
1 ms (Note 2)
T4
Time period for testing
5 ms (Note 2)
T5
Minimum time period from end of testing to next
trigger
0 s
T6
Time period from trigger input to panel load signal
recognition. After this length of time has elapsed, the
LD signal can be changed.
300
μ
s
T7
From Comparator judgement result output to EOM
(LOW): Setting value for Delay Time.
10
μ
s (Note 3)
NOTE
Note1: The chuck can be switched using the INDEX
―――――
signal only when the test
signal level, current and voltage limits, test range, and average are set as
specified below:
Test signal level: Open circuit voltage (V) setting
Current and voltage limits: OFF
Test range: HOLD range
Average: OFF
Note2: Reference value with the following conditions; test frequency:1 kHz, testing
speed:FAST, averaging:OFF, and when measuring | Z |.
For the test time, refer to Section 7.3, "Time Taken for Testing."
Note3: There is an approximate error of 40
μ
s in the delay time entered for
Judgement Result EOM
―――――
for the setting value. When the setting value is
0.0 s, the delay time is approximately 10
μ
s
When the selected panel number falls under either of the following conditions, the
3522-50 begins measurement without loading the measurement conditions:
(1) When more than 2 panel numbers have been selected.
(2) The selected panel number is not stored.
(3) Both the first and third parameters are set to OFF.
(4) The parameters are other than Rs or Rp during DC measurement.
When the measurement conditions are loaded, the external trigger is always set.
The rise time speed of signal line for comparator judgement result output (Pins 6 to
8, 23 to 26) depends on the circuit structure connected to the EXT I/O. Because of
this, the comparator judgement result level immediately after EOM
―――――
output may
cause measurement error. To prevent this, it is possible to set the command of delay
time between comparator judgement result output and EOM
―――――
. In addition, when the
Command setting for judgement result signal line in EXT I/O (:IO:RESult:RESet) is
enabled (ON) and forcibly moved to HIGH level simultaneously with TRIG
―――――
, LOW
HIGH transfer will not occur when evaluation result is outputted immediately after
measurement has finished. As a result, the delay time between the judgement result
output and EOM
―――――
can be minimized. However, take note that the evaluation result
confirmation range is valid until the following triggers are accepted.
During measurement, a trigger input from EXT/ IO or communicating by interface
may lead to the results for the comparator and delay time EOM
―――――
varying widely.
As far as possible, try not to control from external sources when carrying out
measurement.