Package, Pinning, Pad Cells
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netX 50 to netX 51/52 | Migration Guide
DOC120109MG05EN | Revision 5 | English | 2013-08 | Released | Public
2012-2013
3.3
netX 51
3.3.1
Differences in Pinning and Pad Cells
For some of the new features there are some additional external signals necessary. This is done
by sharing the pins with existing functions. This new functions are disabled after power up or reset
that the netX 51 has the same behaviour as the netX 50. To use these features these have to be
enabled by software.
For some reason we had to change some few pad cells with small details which should not create
any problems.
These enhancements and differences are documented in the following chapters.
3.3.1.1
General
Ball Pos
Signal
Pad Type
MUX-Func1
netX
netX
netX
netX
50/51
52
50
51/52
50
51/52
50
51/52
D1 -
CLKOUT
OZ6
IOD6
MMIO48
Table 9: Differences in Pinning and Pad Cells – General
The Clock Signal CLKOUT can now also be configured as additional MMIO Input.
3.3.1.2
Test
Ball Pos
Signal
Pad Type
netX
netX
netX
50/51
52
50
51/52
50
51/52
G5 E3
TEST
BSCAN_TRST
ID IDS
A12 B10
MEM_IF_OM TEST
IUS
ID
Table 10: Differences in Pinning and Pad Cells – Test
For the netX 50 it was quite difficult to activate the Boundary Scan Test Function. The TEST signal
had to be activated and a few MMIO signals must be unconnected or tied at defined logic level.
Now the TEST pin becomes the BSCAN_TRST signal and Boundary Scan can activate with this
signal only. To be backward compatible the original TEST signal is moved to the former
MEM_IF_OM pin which was a reserved signal for an optional System in Package design and was
never used.
The BSCAN_TRST signal has the same level and function to switch on and off as the former TEST
signal.
The netX 50 Technical Reference Manual said about MEM_IF_OM “Connect to GND for normal
operation”. This means for netX 51/52 the TEST signal is disabled. If the former MEM_IF_OM is
not connected to GND this works as well, because this Pad is now changed from a internal pull up
to an pull down Resistor.
