Test scheme for modules ...;
in the PA DRL test adapter, DPL 10 slot
Test programme Pin at +/- Remark
X
X
X
X
1
1
Þ
E
Test both polarities
X
X
X
X
2
2
Þ
E
Test both polarities
X
X
3
1
Þ
2
Test both polarities
X
X
X
X
4
1
Þ
2
Pin 3 and 4 short-circuited internally
Upper slot
X
X
X
X
Upper slot without EF 10 DRL earthing frame
Lower slot
Lower slot
Test object
According to contacting
Test object
X
X
X
X
1 to 10
DPL 10 F ARE...
DPL 10 F BaseT...
DPL 10 F ISDN 5...
DPL 10 G3...
DPL 10...
Type Part No.
Test programme
1
(1
Þ
E)
DPL 10 F ARE 24
907 110
28 38
28
38 - - 0 1
DPL 10 F ARE 110
907 111
134 166 134 166 - - 0 1
DPL 10 F ARE 12
907 112
15
21
15
21 - - 0 1
DPL 10 F 10BaseT
907 113
8
13
8
13 8 14
0 1
DPL 10 F ISDN 5
907 114
66
110
66
110 8 13 0 1
DPL 10 G3 110
907 214
182 279 182 279 - - 0 1
DPL 10 G3 110 FS
907 215
182 279 182 279 - - 0 1
DPL 10 G3 110 FSD
907 216
182 279 182 279 - - 0 1
Test programme
2
(2
Þ
E)
Test programme
3
(1
Þ
2)
Test programme
4
(1
Þ
2, 3-4)
Pin assignment
upper slot DPL 10, DRL
Pin assignment
lower slot DPL 10, DPL 1
Page
21
LLV
in [ V ]
ULV
in [ V ]
ULV
in [ V ]
LLV
in [ V ]
ULV
in [ V ]
LLV
in [ V ]
Tests have to be carried out with both pol/- and -/+!
Except for DPL 10 G3...
Prüfung
Test Pin
1: 1 E
2: 2 E
3: 1 2
4: 1 / 3
2 / 4
(bei: + / -)
(at: + / -)
Polarität
Polarity
+ / -
+ / -
Prüfung
Test
1
2
3
5
4
6
7
8
9
10
1
2
3
4
Prüfling
Test object
Programme
selector switch
Test circuit
selector switch
Polarity
selector switch
ULV
in [ V ]
LLV
in [ V ]
Test object
1 ... 10
Test object
1 ... 10
2
4
1
3
1
2
3
4
1
2
3
4
E
E
1
1
2
3
4
E
1
2
3
4
E
