Atek HP 8753D, User Manual, Page: 676 / 677

concepts, 6-117{137
forward transform mode, 6-118
gating, 6-133
gating procedure, 2-70
general theory, 6-118
low pass, 6-122
low pass impulse mode, 6-117
low pass mode , fault location
measurements, 6-123
low pass mode , reection, 6-123
low pass mode , transmission, 6-125
low pass , setting frequency range, 6-122
low pass step mode, 6-117
masking, 6-127
measurements, 2-68
option, 1-12
range, 6-130
reection response, 2-73
relative velocity factor, 6-119
resolution, 6-131
transform, 6-6
transmission response measurement, 2-68
velocity factor, 2-75
windowing, 6-128
time domain range
dening, 6-11
time for measurements, 7-33
time stamp, 4-30, 11-13
time-to-frequency domain, 6-118
title
area of display, 1-8
of sequence, 2-58
the active channel display, 2-8
titling
the displayed measurement, 4-29
to use fast 2-port calibration, 5-54
trace
dual, 6-8
trace math, 2-7
divide measurement data by the memory
trace, 2-7
trace math operation, 6-6
trace noise
reducing, 5-57
trace viewing, 2-6
tracking, 6-53
an amplitude, 2-25
transfer formats, 7-33
transfer of data, 11-16
transform, 6-6
CW time-to-frequency domain, 6-134
frequency-to-time domain, 6-117
time-to-frequency domain, 6-118
transform measurements
forward, 6-135
transform menu, 6-117
transform modes
time domain bandpass, 6-117
time domain low pass impulse, 6-117
time domain low pass step, 6-117
transistor test xtures, 11-3
transmission measurements
using bandpass mode, 6-121
using low pass mode, 6-125
transmission response in time domain, 2-68
transmission tracking
uncorrected specications, 7-2
trigger menu, 6-18
tri-state drivers (E2), 11-18
TRL calibration, 2-76
TRL* error-correction, 5-23
TRL*/LRM* calibration, 6-85
error model, 6-86
fabricating and dening standards, 6-91
how it works, 6-86
improving raw load match, 6-88
improving raw source match, 6-88
isolation, 6-87
load match, 6-88
options, 6-93
procedure, 6-90
reason for using, 6-85
requirements for standards, 6-90
source match, 6-88
terminology, 6-85
TRL*/LRM* two-port calibration, 6-74
TRL standard modication, 5-28
TRM* error-correction, 5-24
TRM standard modication, 5-30
trouble
solving for printing or plotting, 4-32
with disk storage, 4-43
tsH annotation, 6-19
tsH status notation, 1-8
T (talk mode), 11-19
TTL I/O, 6-140
tuned receiver mode, 3-17, 6-111
compatible sweep types, 2-51
description, 2-51
external source requirements, 2-52
making measurements, 2-51
mixer testing, 6-149
test setup, 2-51
type-F (75) test ports
measurement uncertainties, 7-14, 7-17,
7-20, 7-23
type-F test ports
specications, 7-14
type-N (50) test ports
specications, 7-5
Index-25