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Power Quality Analyzer Model 3945
5.4.1 Opening Previously Stored Transients
The screen below can be accessed with the retrieve
button. It displays a list
transients previously stored in the memory.
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100%
SELECTION OF TRANSIENT
TEST 05
TEST 04
TEST 03
TEST 02
TEST 01
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1
2
3
Figure 5-16
The status bar at the top displays the memory fi lled by stored transients.
Name and transient number (from 01 to 50) for each stored transient.
Transient recording time and date are displayed for each transient.
- To select a transient, press the
buttons, then select it with the
button
- To delete a selected transient, press the
button, then confi rm it with the
button
5.4.2 Storing
the
Trigger
The threshold T in percent, defi ned as an envelope width (over and under) the last
cycle of signal V or A input signal. Its width W is calculated with the nominal mea-
surement range R for a channel (depending on the selected current sensor).
W = T x R
Example:
Using the SR193 probe and a 2% trigger level, the
width would be 1000A x 2% = 20A. Therefore, a deviation of
± 20A will cause a transient event to be captured.
