I.L. 40-385.5
8-2
tacts of the TRIP, BFI, RI1, RI2, RB, AL1, AL2, GS,
Carrier SEND and Carrier STOP functions. It is sup-
plementary to the self-check because the micropro-
cessor self-check routine cannot detect the output
hardware.
If it is not a bench test, all the red-handled FT
switches should be opened before performing the
test to avoid the undesired tripping during tests. How-
ever, due to the opening of the connection between
2FT-14 terminals #13 and #14, the contacts of BFI,
RI1 and RI2 will not be verified.
For performing the output contact test:
(1) Remove JMP10 (spare on the processor
module) and place it in the JMP5 posi-
tion.
(2) Change the LED mode to TEST and
select the tripping function field and the
desired contact in the value field.
(3) Push the ENTER button; the ENTER
LED should be ON. The corresponding
relay should operate when the ENTER
button is pressed.
(4) Remove JMP5 and replace it on JMP10.
8.4
FUNCTIONAL TEST
The functional test simulates the channel condition
for verifying the relay system. The procedure of the
test is:
(1) Change the LED mode to TEST and
select the following desired function field:
RS1, TK.
(2) Push the ENTER button; the ENTER
LED should be ON. The corresponding
function of RS1 (receiver 1) or TK (trans-
mitter keying) will be simulated for the
relay system.
