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2 Safety | 2.1 Intended Use

ZEISS

2 Safety

This chapter contains general requirements for safe working practices. Any person using the De-
vice or commissioned with installation or maintenance must read and observe these general
safety instructions. Knowledge on basic safety instructions and requirements is a precondition for
safe and fault-free operation. Operational safety of the supplied Device is only ensured if it is op-
erated according to its intended use.

If any work is associated with residual risks, this is mentioned in the relevant parts of this docu-
ment in a specific note. When components must be handled with special caution, they are
marked with a warning label. These warnings must always be observed.

2.1 Intended Use

Focal CC is an optional gas injection system for GeminiSEM, Merlin and Sigma field emission scan-
ning electron microscopes (FESEM), equipped with an ultramicrotome stage.

Focal CC is used to increase the image quality by eliminating charging effects. The effect of charg-
ing of non-conducting specimens is eliminated by the injection of gaseous nitrogen above the
specimen surface. The specimen is always located in the evacuated specimen chamber of the FE-
SEM.

Using the Focal CC for any other purpose may be dangerous and is not allowed.

Improper use can easily lead to impairment of its function or even damage to the Device. Damage
caused by incorrect operation, negligence or unauthorized intervention, in particular by removing,
modifying or replacing parts of the device, can not be held liable by the device manufacturer.
Third-party devices or components that are not expressly approved by ZEISS may not be used.

2.2 General Safety Information

This Instruction Manual must be read before commissioning in order to ensure safe and uninter-
rupted operation. Pay particular attention to all listed safety notes. Make sure, that

§

the operating personnel has read and understood this Instruction Manual, associated docu-
ments and particularly all safety regulations and instructions, and applies the same.

§

the local and national safety and accident prevention regulations must be observed, as well as
the applicable laws and regulations in your country.

§

this Instruction Manual is always available with/together with the Device.

§

the Device is always in perfect condition.

§

the Device is secured against access by unauthorized persons.

§

maintenance and repair work, remodeling, removal or replacement of components, as well as
any other intervention in the Device not described in this Instruction Manual, may only be car-
ried out by the manufacturer ZEISS or persons expressly authorized by ZEISS to do so.

2.2.1 Requirements for Operators

The Device, its system components and accessories may only be operated and maintained by au-
thorized and trained personnel. The Device may only be used in accordance this Instruction Man-
ual. If the Device is not used as described, the safety of the user may be impaired and/or the De-
vice may be damaged. Any unauthorized intervention or use other than within the scope of the
intended use shall void all rights to warranty claims. The regional regulations on health protection
and accident prevention must be observed at all times and during all work on and with the De-
vice.

Training

Authorized ZEISS personnel will provide basic training for operating the Device as well as informa-
tion on equipment safety and maintenance work to be conducted by the operator within the
scope of commissioning. The training will be documented by ZEISS and its completion is to be
confirmed by the operator.

8

Instruction Manual ZEISS Focal CC | en-US | Rev. 2 | 349561-8021-000

Содержание Focal CC

Страница 1: ...Instruction Manual ZEISS Focal CC Charge Compensation for Serial Block Face Imaging...

Страница 2: ...archiving purposes shall remain unaffected thereby Any viola tions may be prosecuted as copyright infringements The use of general descriptive names registered names trademarks etc in this document do...

Страница 3: ...ration 15 4 Installation 16 5 First Operating Steps 17 5 1 Prerequisites for Commissioning and Operation 17 5 2 General Guidelines for Working with Focal CC 17 5 3 Vacuum Guidelines for Working with F...

Страница 4: ...Decommissioning 29 8 2 Disposal 29 8 3 Decontamination 29 9 Technical Data and Conformity 30 9 1 Requirements to Run the Focal CC 30 9 2 Applicable Standards and Regulations 30 Glossary 31 Index 32 4...

Страница 5: ...a path in the software Text input Text to be entered by the user Programming and Macros Anything typed in literally during program ming including for example macro codes keywords data types method na...

Страница 6: ...U declarations of conformity ask your ZEISS Sales Service Partner Installation Requirements For more details on technical data refer to the corresponding Installation Requirements Local and National h...

Страница 7: ...SS Portal https portal zeiss com offers various services that simplify the daily work with your ZEISS systems machines and software It is being constantly improved and extended to bet ter meet your ne...

Страница 8: ...be read before commissioning in order to ensure safe and uninter rupted operation Pay particular attention to all listed safety notes Make sure that the operating personnel has read and understood th...

Страница 9: ...le nitrogen or compressed air have a high internal pressure of approximately 200 bar If not properly handled the contained gas can abruptly escape and cause the gas cylinder to move in an uncontrollab...

Страница 10: ...Hazards ZEISS To download the document 1 Go to EIGA homepage www eiga eu 2 Select Publications EIGA Documents 3 From the list select Doc 44 18 4 Click Download 10 Instruction Manual ZEISS Focal CC en...

Страница 11: ...microscope type 1 2 3 2 3 1 Fig 1 Focal CC valved feedthrough at the rear port left at the side port right 1 Hose for nitrogen 2 Gas flow valve 3 Chamber feedthrough Function The gas injection system...

Страница 12: ...se for nitrogen 3 Mount 4 Positioning spring 5 Swing arm 6 Pusher 7 Knife holder 8 Specimen 9 Carbon nozzle 10 Ultramicrotome 11 12 13 14 Fig 3 Focal CC adjustment screws 11 Fine sideways nozzle adjus...

Страница 13: ...ocalized gas flow In the vacuum of the specimen cham ber the gas molecules disperse very quickly as soon as they exit the nozzle tip and so proximity has a large impact on performance 3 2 1 Fig 4 Nozz...

Страница 14: ...r the silicone hose get squashed If any hose is detached the hose has to be pushed back onto the respective connection to ensure continuity between the feedthrough and the carbon nozzle Fig 6 Bayonet...

Страница 15: ...surface in the e beam irradiated area Primary electrons and backscattered electrons from the specimen surface ionize the gas mole cules The electrons released during ionization move away from the spe...

Страница 16: ...tallation requirements are to be observed and adhered to After installation or retrofitting thor oughly check that the Device is in a safe operational state making sure in particular that all pro tect...

Страница 17: ...on in the software such that the gas is continuously flowing when no experiment is being performed The nitrogen gas load places a strain on the vacuum sys tem and will reduce the time period before se...

Страница 18: ...the Focal CC gas flow since it is not automatically turned off when pumping the specimen chamber 5 4 Exchanging the Specimen The nozzle is always located close to the specimen when the ultramicrotome...

Страница 19: ...mode is not available Fig 7 The Charge Compensation section looks slightly different for GeminiSEM left and Sigma right Prerequisite The Focal CC is installed on your system refer to Installation 16 S...

Страница 20: ...mpty resin areas normally show much more charging effects than those containing heavy metal staining The ability to compensate charge is therefore a complex mix of the amount of immobile electrons res...

Страница 21: ...face The system vacuum increases gradually over a period of seconds with increasing Focal CC flow rate 5 6 2 Stopping the Gas Injection Prerequisite The Focal CC is selected in the software refer to S...

Страница 22: ...may be used DANGER Electric shock due to live parts When the Device is still switched on coming in contact with live parts can lead to electric shock or burn 4 Switch off Device prior to opening or c...

Страница 23: ...tures the frag ile carbon nozzle The fine adjustment of the distance of the nozzle to the specimen as it is held by the screw is not easy and will usually require iteration and perhaps help from a col...

Страница 24: ...lateral sideways position of the carbon nozzle It is important that the nozzle does not hit the side of the specimen even if the specimen is raised throughout an extended experiment Procedure 1 Check...

Страница 25: ...adjust the height of the carbon nozzle 1 1 2 Fig 9 Focal CC attached to the ultramicrotome 1 Fixing screws 2 Hex screw for height adjustment Parts and Tools Hex Key Procedure 1 Untighten the fixing s...

Страница 26: ...l CC is supplied with a tool for star screws Keep the tool in a safe place for future use 3 4 1 2 Fig 10 Focal CC adjustment screws 1 Lockable screw mechanism for fine sideways adjustment 2 One of the...

Страница 27: ...ter a period of high vacuum work May require switching the mi croscope off and on again Increasing gas flow does not affect the system vac uum There is a problem with valve or electronic control of th...

Страница 28: ...m and Focal CC is turned off the vacuum condi tions in the column are poor The ion pump has a limited lifespan when the Focal CC is used for extended periods Contact a ZEISS service repre sentative Re...

Страница 29: ...ling of devices in member states of the European Union that ensures suitable reuse according to the EU Directives mentioned The customer is responsible for decontamination Info Detailed information on...

Страница 30: ...safety regulations as well as applicable environmental protection laws and regulations We declare under our sole responsibility that the Device is covered by the CE Declaration of Con formity of the...

Страница 31: ...energy electrons that are liberated from the specimen surface when the specimen is hit by the primary electron beam Secondary electrons are generated by inelastic scattering SEM Scanning Electron Mic...

Страница 32: ...miniSEM 300 CC 30 300 VP 30 450 30 450 VP 30 Control panel 19 20 21 General Safety Information 8 H Hazard High pressure hazard 9 Mechanical hazard 9 Suffocation hazard 9 Hazards 9 Prevention 9 I Insta...

Страница 33: ...ZEISS Index Z ZEISS Portal 7 Service agreements 22 Instruction Manual ZEISS Focal CC en US Rev 2 349561 8021 000 33...

Страница 34: ...Carl Zeiss Promenade 10 07745 Jena Germany phone 49 1803 33 63 34 fax 49 3641 64 3439 info microscopy de zeiss com www zeiss com microscopy Instruction Manual ZEISS Focal CC en US Rev 2 Modifications...

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