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OPERATION
Axio Examiner
Docking station with TFT display
Carl Zeiss
M60-2-0003 e 05/2012
75
•
Press a position button to save the current position. A safety prompt asking whether the
corresponding memory space should be overwritten will appear if a value has already been assigned to
the position button before.
•
Press the
Cancel
button to close the window.
To delete a value, press the
Delete
button, select the position button, and acknowledge the safety
prompt by pressing
Yes
.
Press the
Unit
button to select the desired unit (e.g., millimeters).
(3) Moving to a saved position
Five buttons are located in the position area at the bottom. When a button is pressed, the coordinate
position saved under that button is approached. To save coordinate positions, see
(2) Save
position
above.
4.3.6
Settings
Press the
Settings
button in the navigation bar on the
Home
page, to go to the
Settings
page.
From the
Settings
page, you can go to the
Components
,
User
,
Tools
or
About
pages.
Components
4.3.6.1
The
Settings -> Components
page contains three tabs:
Reflector
,
Focus
and
Miscellaneous
.
(1) Reflector
You can use this tab for configurating the reflector
turret (Figure 4-16).
Five buttons are displayed. These buttons only
show the turret position number as long as no
reflector has been configured.
The following features will be indicated after a
reflector has been assigned: Designation (type),
reflected-light module (AL), transmitted light
module (DL).
When a new reflector is assigned, the
corresponding reflector button will contain
the appropriate information on the
Microscope -> Control
page.
•
To configure a turret position, press the
corresponding button.
Figure 4-16 Settings –> Components ->
Reflector page
Содержание Axio Examiner
Страница 1: ...Operating Manual Axio Examiner Research Microscope...
Страница 13: ...INTRODUCTION Axio Examiner List of interfaces Carl Zeiss M60 2 0003 e 05 2012 13 Figure 1 2 List of interfaces...
Страница 19: ...EQUIPMENT DESCRIPTION Axio Examiner System overview Carl Zeiss M60 2 0003 e 05 2012 19 2 2 System overview...
Страница 20: ...EQUIPMENT DESCRIPTION Carl Zeiss System overview Axio Examiner 20 M60 2 0003 e 05 2012...
Страница 21: ...EQUIPMENT DESCRIPTION Axio Examiner System overview Carl Zeiss M60 2 0003 e 05 2012 21...
Страница 22: ...EQUIPMENT DESCRIPTION Carl Zeiss System overview Axio Examiner 22 M60 2 0003 e 05 2012...
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