VeEX RXT-6000e, Руководство пользователя

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BERT Setup - Data selection - (Layer 1 Unframed)
Layer 1 Unframed Test Patterns
HFPAT (High Frequency Pattern): This test pattern is to test random jitter (RJ) at a BER of 10-
12, and also to test the asymmetry of transition times. This high frequency test pattern generates a
one, or light on, for a duration of 1 bit time, followed by a zero, or light off, for a duration of 1 bit
time. This pattern can be generated by the repeated transmission of the D21.5 code-group. Disparity
rules are followed.
LFPAT (Low Frequency Pattern): The intent of this test pattern is to test low frequency RJ and
also to test PLL tracking error. This low frequency test pattern generates a one, or light on, for a
duration of 5 bit times, followed by a zero, or light off, for a duration of 5 bit times. This pattern
can be generated by the repeated transmission of the K28.7 code-group. Disparity rules are
followed.
MFPAT (Mixed Frequency Pattern):
The intent of this test pattern is to test the combination of
RJ and deterministic jitter (DJ). This mixed frequency test pattern generates a one, or light on, for a
duration of 5 bit times, followed by a zero, or light off, for a duration of 1 bit times, followed by a
one for 1 bit time followed by a zero for 1 bit time followed by a one for 2 bit times followed by a
zero for 5 bit times followed by a one for 1 bit time followed by a zero for 1 bit time followed by a
one for 1 bit time followed by a zero for 2 bit times. This pattern can be generated by the repeated
transmission of the K28.5 code-group. Disparity rules are followed.
RDPAT (Random Data Pattern): Designed to provide energy across the entire frequency
spectrum providing good simple BER testing.
JTPAT (Jitter Tolerance Pattern): Designed to verify jitter tolerance on the receivers by
exposing a receiver's CDR to large instantaneous phase jumps. The pattern alternates repeating low
transition density patterns with repeating high transition density patterns.
SNPAT (Supply Noise Pattern):
Designed to simulate the worst case power supply noise that
could be introduced by a transceiver.
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Layer 2, 3, & 4 test patterns (40GE and 100GE only support up to Layer 3)
PRBS:
2^31 -1 (147 483 647-bit pattern used for special measurement tasks, [e.g., delay
measurements at higher bit rates])
2^23 -1 (8 388 607 bit pattern primarily intended for error and jitter measurements at bit rates
of 34 368 and 139 264 kbps)
2^15 -1 (32 767 bit pattern primarily intended for error and jitter measurements at bit rates of
1544, 2048, 6312, 8448, 32 064 and 44 736 kbps)
2^11 -1 (2047 bit pattern primarily intended for error and jitter measurements on circuits
operating at bit rates of 64 kbps and N x 64 kbps)
RXT-6200_RXT6000e_Module_Manual Page 221 of 387